Abstract: Electrostatic discharge (ESD) protection circuitry in an integrated circuit is provided. The protection circuitry includes a trigger circuit coupled between a first power supply bus and a second power supply bus. A delay circuit is coupled to receive an output signal from the trigger circuit. The delay circuit includes a first inverter coupled to the input of the delay circuit and a feedback transistor having a control terminal coupled to the output of the delay circuit, a first current electrode coupled to the first power supply bus, and a second current electrode coupled to the output of the first inverter. A clamp driver circuit is coupled to the output of the delay circuit.

Abstract: Electrostatic discharge (ESD) protection circuitry in an integrated circuit is provided. The protection circuitry includes a trigger circuit coupled between a first power supply bus and a second power supply bus. A delay circuit is coupled to receive an output signal from the trigger circuit. The delay circuit includes a first inverter coupled to the input of the delay circuit and a feedback transistor having a control terminal coupled to the output of the delay circuit, a first current electrode coupled to the first power supply bus, and a second current electrode coupled to the output of the first inverter. A clamp driver circuit is coupled to the output of the delay circuit.

Abstract: An electrostatic discharge (ESD)-triggered protection apparatus includes an ESD trigger circuit having a set of diodes coupled to a resistor. An ESD discharge device is coupled to the ESD trigger circuit. Further, a pre-driver circuit coupled between the ESD trigger circuit and the ESD discharge device.

Abstract: A circuit implements a method to adjust input/output (I/O) characteristics of an I/O pad circuit (10) depending upon which value of an I/O supply voltage is used within a range of supply voltages. An I/O supply voltage being supplied to the pad circuit is detected by detecting (18, 20) its value relative to a known reference (16). Portions of the I/O pad circuit are selectively enabled in response to the detected I/O supply voltage. By selecting the ratio of P-channel and N-channel transistors, physical characteristics of the circuit are controlled. Examples of the controlled physical characteristics include slew rate, signal rise and fall times, and duty cycle control which is controlled by forcing all rising and falling edges to have a midpoint at the same point in time. Therefore a same I/O pad circuit may be optimally used in numerous applications regardless of the supply voltage value.

Abstract: A circuit implements a method to adjust input/output (I/O) characteristics of an I/O pad circuit (10) depending upon which value of an I/O supply voltage is used within a range of supply voltages. An I/O supply voltage being supplied to the pad circuit is detected by detecting (18, 20) its value relative to a known reference (16). Portions of the I/O pad circuit are selectively enabled in response to the detected I/O supply voltage. By selecting the ratio of P-channel and N-channel transistors, physical characteristics of the circuit are controlled. Examples of the controlled physical characteristics include slew rate, signal rise and fall times, and duty cycle control which is controlled by forcing all rising and falling edges to have a midpoint at the same point in time. Therefore a same I/O pad circuit may be optimally used in numerous applications regardless of the supply voltage value.