Patents by Inventor Cyril Degrelle

Cyril Degrelle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8497993
    Abstract: A static interferometer comprises an entrance pupil, a splitter plate, a first mirror and a second mirror which are arranged in such a way that light beams originating from a collimated source are divided on the splitter plate, reflect on each of the mirrors and recombine while interfering at the output of the interferometer. The interferometer comprises a prismatic plate of index n comprising a variable thickness ej, the first beam passing through the prismatic plate before reflecting on a reflecting surface of the first mirror, the reflecting surface comprising a plurality of zones, each zone j being situated at a mean distance ?j from a reference plane. The reference plane being perpendicular to an optical axis and corresponding to a position of a plane mirror for which the optical path difference between the two interfering reflected beams is zero, each thickness ej being substantially equal to ?j·n/(n?1).
    Type: Grant
    Filed: August 8, 2010
    Date of Patent: July 30, 2013
    Assignee: Thales
    Inventors: Christophe Buisset, Denis Simeoni, Patrick Astruc, Cyril Degrelle
  • Publication number: 20130003072
    Abstract: The invention relates to a field-compensated interferometer (1) including an optical assembly (2) for directing incident light beams (4) having a field angle ? relative to an optical axis of the interferometer (1), into arms (5, 6) of the interferometer, and a beam splitter (12), the arms (5, 6) including at least one mechanically movable optical device (15, 16) for generating a variable optical path difference between beams generated by the separation of each incident beam (4) using said beam splitter (12), said interferometer (1) being characterized in that it includes at least one field compensation optical element (E) arranged in one or the other of the image focal planes of the optical assembly (2), said image focal planes being combined relative to the beam splitter (12), said element (E) including at least one surface (9) that is curved so as to generate a path difference between the incident beams having a non-zero field angle and the incident beams having a zero field angle, the generated path differ
    Type: Application
    Filed: August 30, 2010
    Publication date: January 3, 2013
    Inventors: Christian Buil, Laurence Buffet, Bruno Belon, Cyril Degrelle, Christophe Buisset, Denis Simeoni
  • Publication number: 20110032530
    Abstract: A static interferometer comprises an entrance pupil, a splitter plate, a first mirror and a second mirror which are arranged in such a way that light beams originating from a collimated source are divided on the splitter plate, reflect on each of the mirrors and recombine while interfering at the output of the interferometer. The interferometer comprises a prismatic plate of index n comprising a variable thickness ej, the first beam passing through the prismatic plate before reflecting on a reflecting surface of the first mirror, the reflecting surface comprising a plurality of zones, each zone j being situated at a mean distance ?j from a reference plane. The reference plane being perpendicular to an optical axis and corresponding to a position of a plane mirror for which the optical path difference between the two interfering reflected beams is zero, each thickness ej being substantially equal to ?j·n/(n?1).
    Type: Application
    Filed: August 8, 2010
    Publication date: February 10, 2011
    Applicant: THALES
    Inventors: Christophe Buisset, Denis Simeoni, Patrick Astruc, Cyril Degrelle
  • Patent number: 7561262
    Abstract: The invention relates to a satellite metrology system for satellite formation flight comprising at least one reference satellite (SR) and one secondary satellite (SS). In the reference satellite, an optical source (SO) emits a light beam intended to illuminate the secondary satellite (SS) and a set of light detectors (CCD) detects the light reflected by the secondary satellite. A measuring circuit (CI) is used for detecting the detector or detectors that receive the light from the secondary satellite. In the secondary satellite (SS) at least one reflector (RR1) receives the illumination light from the reference satellite and reflects it towards the set of detectors (CCD) of the reference satellite.
    Type: Grant
    Filed: June 27, 2007
    Date of Patent: July 14, 2009
    Assignee: Thales
    Inventors: Bruno Napierala, Cyril Degrelle, Xavier Leyre, Suzanne Abadie
  • Publication number: 20080002191
    Abstract: The invention relates to a satellite metrology system for satellite formation flight comprising at least one reference satellite (SR) and one secondary satellite (SS). In the reference satellite, an optical source (SO) emits a light beam intended to illuminate the secondary satellite (SS) and a set of light detectors (CCD) detects the light reflected by the secondary satellite. A measuring circuit (CI) is used for detecting the detector or detectors that receive the light from the secondary satellite. In the secondary satellite (SS) at least one reflector (RR1) receives the illumination light from the reference satellite and reflects it towards the set of detectors (CCD) of the reference satellite.
    Type: Application
    Filed: June 27, 2007
    Publication date: January 3, 2008
    Applicant: Thales
    Inventors: Bruno NAPIERALA, Cyril Degrelle, Xavier Leyre, Suzanne Abadie