Patents by Inventor Cyril LANGLOIS

Cyril LANGLOIS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for mapping crystal orientations in a sample made of a polycrystalline material
    Patent number: 10062145
    Abstract: The invention relates to a method for mapping the crystal orientations of a polycrystalline material, the method comprising: receiving (21) a series of images of the polycrystalline material, which images are acquired by an acquiring device in respective irradiation geometries; estimating (22) at least one intensity profile for at least one point of the material from the series of images, each intensity profile representing the intensity associated with the point in question as a function of irradiation geometry; and determining (24) a crystal orientation for each point in question of the material by comparing (23) the intensity profile associated with said point in question to theoretical signatures of intensity profiles of known crystal orientations, which signatures are contained in a database.
    Type: Grant
    Filed: January 23, 2015
    Date of Patent: August 28, 2018
    Assignees: INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE LYON, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), UNIVERSITE CLAUDE BERNARD LYON 1
    Inventor: Cyril Langlois
  • METHOD FOR MAPPING CRYSTAL ORIENTATIONS IN A SAMPLE MADE OF A POLYCRYSTALLINE MATERIAL
    Publication number: 20170011518
    Abstract: The invention relates to a method for mapping the crystal orientations of a polycrystalline material, the method comprising: receiving (21) a series of images of the polycrystalline material, which images are acquired by an acquiring device in respective irradiation geometries; estimating (22) at least one intensity profile for at least one point of the material from the series of images, each intensity profile representing the intensity associated with the point in question as a function of irradiation geometry; and determining (24) a crystal orientation for each point in question of the material by comparing (23) the intensity profile associated with said point in question to theoretical signatures of intensity profiles of known crystal orientations, which signatures are contained in a database.
    Type: Application
    Filed: January 23, 2015
    Publication date: January 12, 2017
    Inventor: Cyril LANGLOIS