Patents by Inventor D. Scott Baeder

D. Scott Baeder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Predictive run testing
    Patent number: 8689187
    Abstract: A test object can be selectively included in a test run based on predicting the behavior of the test object. In one embodiment, the present invention includes predicting how likely the test object is to produce a failure in a test run and deciding whether to include the test object in the test run based on the predicted likelihood. This likelihood of producing a failure may be based on any number of circumstances. For example, these circumstances may include the history of prior failures and/or the length of time since the test object was last included in a test run.
    Type: Grant
    Filed: May 7, 2007
    Date of Patent: April 1, 2014
    Assignee: Cadence Design Systems, Inc.
    Inventors: Steven G. Esposito, Kiran Chhabra, Saran Prasad, D. Scott Baeder
  • Predictive run testing
    Publication number: 20080282124
    Abstract: A test object can be selectively included in a test run based on predicting the behavior of the test object. In one embodiment, the present invention includes predicting how likely the test object is to produce a failure in a test run and deciding whether to include the test object in the test run based on the predicted likelihood. This likelihood of producing a failure may be based on any number of circumstances. For example, these circumstances may include the history of prior failures and/or the length of time since the test object was last included in a test run.
    Type: Application
    Filed: May 7, 2007
    Publication date: November 13, 2008
    Inventors: Steven G. Esposito, Kiran Chhabra, Saran Prasad, D. Scott Baeder