Abstract: An embodiment of the present disclosure provides a manipulator for a finishing work, including: a base; an arm comprising a plurality of links, a plurality of joints connecting the plurality of links, and a plurality of actuators generating rotation of at least some of the plurality of joints; and a processor determining a driving torque of each of the plurality of actuators considering a self-weight effect of the manipulator and controlling the plurality of actuators based on the determined driving torque.

Abstract: The present disclosure relates to a surface inspection method using a mold surface inspection device, and more specifically, to a surface inspection method using a mold surface inspection device including a setting part in which an inspection object is set, a light source part configured to irradiate the inspection object with irradiated light so that a reflective highlight is generated on a surface of the inspection object, an imaging part configured to image the surface of the inspection object so that a highlight region where a reflective highlight is generated is included, and an image processing part configured to process an image imaged in the imaging part to provide the image to a worker so that the worker determines whether defects are generated on the surface of the inspection object on the basis of the image.

Abstract: An embodiment of the present disclosure provides a manipulator for a finishing work, including: a base; an arm comprising a plurality of links, a plurality of joints connecting the plurality of links, and a plurality of actuators generating rotation of at least some of the plurality of joints; and a processor determining a driving torque of each of the plurality of actuators considering a self-weight effect of the manipulator and controlling the plurality of actuators based on the determined driving torque.

Abstract: The present disclosure relates to a surface inspection method using a mold surface inspection device, and more specifically, to a surface inspection method using a mold surface inspection device including a setting part in which an inspection object is set, a light source part configured to irradiate the inspection object with irradiated light so that a reflective highlight is generated on a surface of the inspection object, an imaging part configured to image the surface of the inspection object so that a highlight region where a reflective highlight is generated is included, and an image processing part configured to process an image imaged in the imaging part to provide the image to a worker so that the worker determines whether defects are generated on the surface of the inspection object on the basis of the image.

Abstract: Disclosed is a real time confocal microscope using a dispersion optics comprising: a broad band light source for supplying light; an illumination optics for illuminating onto a slit aperture by collecting the light emitted from the light source; the slit aperture for only passing a region of the slit among the light illuminated from the illuminating optics; a tube lens for making the lights passing through the slit aperture to be parallel lights; a first dispersion optics for making the parallel lights emitted from the tube lens propagate in different angles according to wavelengths; an objective lens for illuminating the lights emitted from the first dispersion optics on a specimen; a first image formation lens for making the lights reflected from the specimen and passing through the slit aperture 805 to be parallel lights; a second dispersion optics for making the parallel lights emitted from the first image formation lens propagate in different angles according to wavelengths; a second image formation lens

Abstract: The present invention relates to confocal self-interference microscopy. The confocal self-interference microscopy further includes a first polarizer for polarizing reflected or fluorescent light from a specimen, a first birefringence wave plate for separating the light from the first polarizer into two beams along a polarizing direction, a second polarizer for polarizing the two beams from the first birefringence wave plate, a second birefringence wave plate for separating the two beams from the second polarizer into four beams along the polarizing direction, and a third polarizer for polarizing the four beams from the second birefringence wave plate, in the existing confocal microscopy.

Abstract: The present invention relates to a method for reducing auto-fluorescence signals from a sample tissue in confocal Raman microscopy and to a method for diagnosing skin cancers using the same method. Raman spectroscopy has strong potential for providing non-invasive diagnosis of skin cancer. Auto-fluorescence signals from tissues, which interfere with the Raman signals, were greatly reduced using a confocal slit adjustment. Distinct Raman band differences between normal and BCC tissues for the amide I mode, the amide III mode and the PO2? symmetric stretching mode, showed that the present invention has strong potential for use as a dermatological diagnostic tool without the need for statistical treatment of spectral data. It was also possible to precisely differentiate BCC tissue from surrounding non-cancerous tissue using the confocal Raman depth profiling technique.