Patents by Inventor Dag T. Wang

Dag T. Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for mass analysis of samples
    Patent number: 7533587
    Abstract: The present invention comprises an apparatus and a method for mass analyses of an array of samples contained in distinct sample holders. The sample holders are placed on a plurality of sensors which preferably comprise an array of microbalances providing output signals comprising mass data on the array of samples.
    Type: Grant
    Filed: June 25, 2007
    Date of Patent: May 19, 2009
    Assignee: UOP LLC
    Inventors: Rune Wendelbo, Duncan E. Akporiaye, Arne Karlsson, Ib-Rune Johansen, Ivar M. Dahl, Britta G. Fismen, Richard Blom, Dag T. Wang, Morten Gulliksen, Martin Plassen
  • Method and apparatus for mass analysis of samples
    Patent number: 7533586
    Abstract: The present invention comprises an apparatus and a method for mass analyses of an array of samples contained in distinct sample holders. The sample holders are placed on a plurality of sensors which preferably comprise an array of microbalances providing output signals comprising mass data on the array of samples.
    Type: Grant
    Filed: October 4, 2005
    Date of Patent: May 19, 2009
    Assignee: UOP LLC
    Inventors: Rune Wendelbo, Duncan E. Akporiaye, Arne Karlsson, Ib-Rune Johansen, Ivar M. Dahl, Britta G. Fismen, Richard Blom, Dag T. Wang, Morten Gulliksen, Martin Plassen
  • Method and apparatus for mass analysis of samples
    Patent number: 7279131
    Abstract: The present invention comprises an apparatus and a method for mass analyses of an array of samples contained in distinct sample holders. The sample holders are placed on a plurality of sensors which preferably comprise an array of microbalances providing output signals comprising mass data on the array of samples.
    Type: Grant
    Filed: July 1, 2004
    Date of Patent: October 9, 2007
    Assignee: UOP LLC
    Inventors: Rune Wendelbo, Duncan E. Akporiaye, Arne Karlsson, Ib-Rune Johansen, Ivar M. Dahl, Britta G. Fismen, Richard Blom, Dag T. Wang, Morten Gulliksen, Martin Plassen
  • Spring scale
    Patent number: 7078631
    Abstract: A spring scale, in particular for weighing loads in the ?g-mg range, comprises a load platform suspended by at least three flexural springs in a surrounding frame, and has bridge-connected strain gauges arranged for measuring strain on one side of the flexural springs. The flexural springs extend in succession along substantially the whole periphery of the load platform in a gap between the load platform and the inner edge of the frame, and an attachment spot on the load platform for every flexural spring is arranged substantially directly opposite or past an attachment spot on the inner edge of the frame for a next flexural spring in the succession of springs. Preferably, the spring scale is made in one piece, and manufactured by means of semiconductor process technology.
    Type: Grant
    Filed: February 24, 2003
    Date of Patent: July 18, 2006
    Assignee: Sintef Elektronikk OG Kybernetikk
    Inventors: Dag T. Wang, Ralph W. Bernstein, Geir Uri Jensen, Eivind Lund