Patents by Inventor Daigo YOSHIKAWA

Daigo YOSHIKAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9662081
    Abstract: This invention provides an X-ray CT image processing method that allows more flexible expression by expressing X-ray absorption coefficients probabilistically, makes it possible to acquire reconstructed images that are comparable to those obtained by conventional methods but involve lower X-ray doses, and can reduce beam-hardening artifacts. A probability distribution for the observation of projected X-rays is set and statistical inference is performed. Said probability distribution is expressed in terms of the process of observing a multiple-X-ray sum resulting from multiple projected X-rays being incident upon a detector. Bayesian inference in which the expected value of the posterior distribution is used for statistical inference is performed on the basis of a prior distribution for X-ray absorption coefficients, said prior distribution having parameters for the material and the observation process in terms of which the multiple-X-ray sum is expressed.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: May 30, 2017
    Assignee: Kyoto University
    Inventors: Shinichi Maeda, Daigo Yoshikawa, Takumi Tanaka, Shin Ishii
  • Publication number: 20160120493
    Abstract: This invention provides an X-ray CT image processing method that allows more flexible expression by expressing X-ray absorption coefficients probabilistically, makes it possible to acquire reconstructed images that are comparable to those obtained by conventional methods but involve lower X-ray doses, and can reduce beam-hardening artifacts. A probability distribution for the observation of projected X-rays is set and statistical inference is performed. Said probability distribution is expressed in terms of the process of observing a multiple-X-ray sum resulting from multiple projected X-rays being incident upon a detector. Bayesian inference in which the expected value of the posterior distribution is used for statistical inference is performed on the basis of a prior distribution for X-ray absorption coefficients, said prior distribution having parameters for the material and the observation process in terms of which the multiple-X-ray sum is expressed.
    Type: Application
    Filed: May 15, 2014
    Publication date: May 5, 2016
    Inventors: Shinichi MAEDA, Daigo YOSHIKAWA, Takumi TANAKA, Shin ISHII