Patents by Inventor Daiki Kurihara

Daiki Kurihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230201820
    Abstract: A container of the present invention includes a tube part and a spiral plate disposed inside the tube part. The spiral plate includes a spiral groove for converting a flow of a liquid moving inside the tube part into a vortex flow.
    Type: Application
    Filed: December 21, 2022
    Publication date: June 29, 2023
    Inventors: Shigeru UEMURA, Koji NOGUCHI, Daiki KURIHARA
  • Patent number: 8013621
    Abstract: Disclosed is an inspection method capable of performing an inspection of high reliability even for very fine and thin-film electrode pads of a target object, by using needle traces formed on the electrode pads and making the electrode pads repeatedly contact the probes at high accuracy. In the inspection method, under the control of a control unit 15 of an inspection apparatus 10, by using old needle traces formed on the respective pads P of the target object such as a semiconductor wafer W, contactable regions S for the probes 12A in preparation for a present inspection, so that each of the probes 12A contact each of the electrode pad P in the contactable region S and within an empty area with no needle trace.
    Type: Grant
    Filed: January 23, 2009
    Date of Patent: September 6, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Satoshi Sano, Daiki Kurihara
  • Publication number: 20090184729
    Abstract: Disclosed is an inspection method capable of performing an inspection of high reliability even for very fine and thin-film electrode pads of a target object, by using needle traces formed on the electrode pads and making the electrode pads repeatedly contact the probes at high accuracy. In the inspection method, under the control of a control unit 15 of an inspection apparatus 10, by using old needle traces formed on the respective pads P of the target object such as a semiconductor wafer W, contactable regions S for the probes 12A in preparation for a present inspection, so that each of the probes 12A contact each of the electrode pad P in the contactable region S and within an empty area with no needle trace.
    Type: Application
    Filed: January 23, 2009
    Publication date: July 23, 2009
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Satoshi Sano, Daiki Kurihara
  • Patent number: 7477064
    Abstract: In a prober, a post-contact image representing a region including a pad is acquired by capturing an image of a substrate after a probe has been brought into contact with the pad having an existing probe mark. An image storage unit stores in advance a pre-contact image representing the pad-inclusive region before the probe is brought into contact with the pad. A latest probe mark position acquiring unit acquires a position of a latest probe mark region created by the contact of the probe with the pad from among a plurality of probe mark regions in the post-contact image respectively corresponding to a plurality of probe marks on the pad by comparing the post-contact image with the pre-contact image. A positional deviation acquiring unit finds a deviation in a contact position of the probe with respect to the pad, based on the position of the latest probe mark region.
    Type: Grant
    Filed: March 23, 2006
    Date of Patent: January 13, 2009
    Assignee: Tokyo Electron Limited
    Inventors: Daiki Kurihara, Hiromi Chaya, Takanori Hyakudomi
  • Publication number: 20060238905
    Abstract: In a prober, a post-contact image representing a region including a pad is acquired by capturing an image of a substrate after a probe has been brought into contact with the pad having an existing probe mark. An image storage unit stores in advance a pre-contact image representing the pad-inclusive region before the probe is brought into contact with the pad. A latest probe mark position acquiring unit acquires a position of a latest probe mark region created by the contact of the probe with the pad from among a plurality of probe mark regions in the post-contact image respectively corresponding to a plurality of probe marks on the pad by comparing the post-contact image with the pre-contact image. A positional deviation acquiring unit finds a deviation in a contact position of the probe with respect to the pad, based on the position of the latest probe mark region.
    Type: Application
    Filed: March 23, 2006
    Publication date: October 26, 2006
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Daiki Kurihara, Hiromi Chaya, Takanori Hyakudomi
  • Patent number: 5027225
    Abstract: An apparatus for fabricating a pre-press masking film used for correcting a color printing plate which is slightly tilted by a scanner based on an image edited by a layout system. The apparatus includes a coordinate data input unit for inputting coordinate data defining a trimming frame designated by the layout system, a tilt correcting unit for compensating for the tilt of the color printing plate by correcting the coordinate data, a unit for generating driving signals for forming a pre-press masking film based on the corrected coordinate data, and a cutter unit responsive to the driving signal for forming a pre-press masking film for cutting the masking film.
    Type: Grant
    Filed: January 31, 1989
    Date of Patent: June 25, 1991
    Assignee: Dainippon Screen Mfg. Co., Ltd.
    Inventors: Daiki Kurihara, Takashi Miyake