Patents by Inventor Daiske Katsuta

Daiske Katsuta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nondestructive inspection method and apparatus
    Patent number: 7215807
    Abstract: The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.
    Type: Grant
    Filed: July 26, 2005
    Date of Patent: May 8, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Mineo Nomoto, Daiske Katsuta, Toshio Asano, Kaoru Sakai, Tetsuo Taguchi, Isao Tanaka
  • Nondestructive inspection method and apparatus
    Publication number: 20050259861
    Abstract: The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.
    Type: Application
    Filed: July 26, 2005
    Publication date: November 24, 2005
    Applicant: Hitachi, Ltd.
    Inventors: Mineo Nomoto, Daiske Katsuta, Toshio Asano, Kaoru Sakai, Tetsuo Taguchi, Isao Tanaka
  • Nondestructive inspection method and apparatus
    Patent number: 6950545
    Abstract: The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.
    Type: Grant
    Filed: October 26, 2000
    Date of Patent: September 27, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Mineo Nomoto, Daiske Katsuta, Toshio Asano, Kaoru Sakai, Tetsuo Taguchi, Isao Tanaka