Abstract: A semiconductor memory device includes a memory cell array, a first pad electrode that receives write data and outputs read data, a comparator having one input terminal connected to the first pad electrode and the other input terminal to which a reference voltage is applied, a latch circuit that latches an output signal of the comparator corresponding to a latch enable signal, and a second pad electrode to which the latch enable signal is supplied at the input of the write data. This semiconductor memory device receives a plurality of bits of test data input via the first pad electrode, and generates data indicating whether or not a bit error has occurred at the input of the test data in the write data training operation. This semiconductor memory device is configured to be able to output the data indicating whether or not the bit error has occurred.

Abstract: According to an embodiment, a memory system includes a non-volatile memory including a plurality of memory cells each capable of storing at least a first bit, a second bit, and a third bit, and a memory controller configured to control the non-volatile memory. The non-volatile memory is configured to output first hard bit data of the first bit, second hard bit data of the second bit, third hard bit data of the third bit, and fourth soft bit data for the first bit, the second bit, and the third bit to the memory controller. The memory controller is configured to execute error correction processing using the first hard bit data, the second hard bit data, the third hard bit data, and the fourth soft bit data.

Abstract: According to an embodiment, a memory system comprising: a non-volatile memory including a plurality of memory cells each capable of storing at least a first bit and a second bit, and configured to calculate third soft bit data based on a logical sum calculation using at least first soft bit data corresponding to the first bit and second soft bit data corresponding to the second bit; and a memory controller configured to restore the first soft bit data and the second soft bit data based on at least first hard bit data corresponding to the first bit, second hard bit data corresponding to the second bit, and the third soft bit data.

Abstract: A semiconductor memory device includes a memory cell array including memory cells, word lines connected to the cells, bit lines connected to the cells, and a control circuit configured to execute, in response to a command sequence for writing data into a first memory cell connected to a first word line, a loop one or more times, each loop including a program operation for writing data into the first memory cell and a verification operation for verifying the data. The sequence indicates a level of a threshold voltage to be set to a second memory cell connected to a second word line adjacent to the first word line. The control circuit is configured to, after exiting the loop, determine whether to execute an operation to adjust a threshold voltage of the first memory cell based on the level of the threshold voltage to be set in the second memory cell.

Abstract: According to an embodiment, a memory system comprising: a non-volatile memory including a plurality of memory cells each capable of storing at least a first bit and a second bit, and configured to calculate third soft bit data based on a logical sum calculation using at least first soft bit data corresponding to the first bit and second soft bit data corresponding to the second bit; and a memory controller configured to restore the first soft bit data and the second soft bit data based on at least first hard bit data corresponding to the first bit, second hard bit data corresponding to the second bit, and the third soft bit data.

Abstract: A non-volatile memory of an embodiment includes: a memory cell array including a plurality of memory cell transistors; a plurality of word lines connected to a plurality of gates of the plurality of respective memory cell transistors; a VPGM monitor connected to at least one of the plurality of word lines; and a sequencer. When writing voltage is applied to a selected word line selected from among the plurality of word lines at data writing to the memory cell array, the sequencer detects voltage of the selected word line through the VPGM monitor and determines whether detected voltage obtained through the detection has reached a predetermined value.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory that includes memory cells. The nonvolatile memory outputs, to a memory controller, first hard bit data of the first bit, second hard bit data of the second bit, third hard bit data of the third bit, and fourth soft bit data related to the first bit, the second bit, and the third bit, in response to a first command set. The nonvolatile memory outputs, to the memory controller, the first hard bit data, the second hard bit data, the third hard bit data, first soft bit data related to the first bit, second soft bit data related to the second bit, and third soft bit data related to the third bit, in response to a second command set.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory that includes memory cells. The nonvolatile memory outputs, to a memory controller, first hard bit data of the first bit, second hard bit data of the second bit, third hard bit data of the third bit, and fourth soft bit data related to the first bit, the second bit, and the third bit, in response to a first command set. The nonvolatile memory outputs, to the memory controller, the first hard bit data, the second hard bit data, the third hard bit data, first soft bit data related to the first bit, second soft bit data related to the second bit, and third soft bit data related to the third bit, in response to a second command set.

Abstract: A storage device includes a memory cell array, an input/output circuit, and a logic circuit. The input/output circuit including an input/output signal line through which data to be written into the memory cell array is received and data read from the memory cell array is transmitted. The logic circuit is configured to output a first signal to the input/output circuit. The first signal at an active level enables at least a part of the input/output circuit. The logic circuit includes a latch circuit configured to output a second signal at a level corresponding to a value of latched data. The logic circuit receives third, fourth, and fifth signals from an outside of the storage device via the input/output circuit. The logic circuit outputs a negative logical product of the third signal and a logical sum of at least the second, fourth, and fifth signals as the first signal.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory that includes memory cells. The nonvolatile memory outputs, to a memory controller, first hard bit data of the first bit, second hard bit data of the second bit, third hard bit data of the third bit, and fourth soft bit data related to the first bit, the second bit, and the third bit, in response to a first command set. The nonvolatile memory outputs, to the memory controller, the first hard bit data, the second hard bit data, the third hard bit data, first soft bit data related to the first bit, second soft bit data related to the second bit, and third soft bit data related to the third bit, in response to a second command set.

Abstract: According to an embodiment, a memory system includes a non-volatile memory including a plurality of memory cells each capable of storing at least a first bit, a second bit, and a third bit, and a memory controller configured to control the non-volatile memory. The non-volatile memory is configured to output first hard bit data of the first bit, second hard bit data of the second bit, third hard bit data of the third bit, and fourth soft bit data for the first bit, the second bit, and the third bit to the memory controller. The memory controller is configured to execute error correction processing using the first hard bit data, the second hard bit data, the third hard bit data, and the fourth soft bit data.

Abstract: A semiconductor memory device includes: a core unit including first and second memory cell groups; and a control circuit. The control circuit is configured to, in response to a read command including designation of a first address and designation of a second address, read first data from the first memory cell group, read second data from the second memory cell group, and output third data and fourth data in parallel. The first and second addresses correspond to the first and second memory cell groups, respectively. The designation of the second address is made after the designation of the first address. The third data corresponds to the read first data. The fourth data corresponds to the read second data.

Abstract: According to an embodiment, a memory system comprising: a non-volatile memory including a plurality of memory cells each capable of storing at least a first bit and a second bit, and configured to calculate third soft bit data based on a logical sum calculation using at least first soft bit data corresponding to the first bit and second soft bit data corresponding to the second bit; and a memory controller configured to restore the first soft bit data and the second soft bit data based on at least first hard bit data corresponding to the first bit, second hard bit data corresponding to the second bit, and the third soft bit data.

Abstract: A semiconductor memory device includes: a core unit including first and second memory cell groups; and a control circuit. The control circuit is configured to, in response to a read command including designation of a first address and designation of a second address, read first data from the first memory cell group, read second data from the second memory cell group, and output third data and fourth data in parallel. The first and second addresses correspond to the first and second memory cell groups, respectively. The designation of the second address is made after the designation of the first address. The third data corresponds to the read first data. The fourth data corresponds to the read second data.

Abstract: A non-volatile memory of an embodiment includes: a memory cell array including a plurality of memory cell transistors; a plurality of word lines connected to a plurality of gates of the plurality of respective memory cell transistors; a VPGM monitor connected to at least one of the plurality of word lines; and a sequencer. When writing voltage is applied to a selected word line selected from among the plurality of word lines at data writing to the memory cell array, the sequencer detects voltage of the selected word line through the VPGM monitor and determines whether detected voltage obtained through the detection has reached a predetermined value.

Abstract: A semiconductor storage device of an embodiment includes a control circuit configured to execute a writing sequence in which a loop including a program operation that writes data to memory cells and a program verify operation that verifies the data written in the memory cells is repeated a plurality of times by increasing a program voltage by a predetermined step-up voltage each time, the control circuit being capable of executing reading verify that verifies the data written in the memory cells in the writing sequence, and the control circuit detects characteristic variation of a characteristic that causes disturbance, and determines whether to perform the reading verify based on a result of the detection.

Abstract: A method for controlling a memory system, including a controller chip and a non-volatile memory chip which includes a calibration control circuit, a first output buffer, and a first resistance element, includes receiving a read command from the controller, setting a ready/busy signal to a busy state based on the read command, executing a calibration operation which controls an impedance of the first output buffer based on the read command, setting the ready/busy signal to a ready state, and sending data to the control chip in response to the read command. The calibration control circuit calibrates the impedance of the first output buffer circuit by using the first resistance element within a period in which the ready/busy signal is the busy state.

Abstract: A semiconductor storage device of an embodiment includes a control circuit configured to execute a writing sequence in which a loop including a program operation that writes data to memory cells and a program verify operation that verifies the data written in the memory cells is repeated a plurality of times by increasing a program voltage by a predetermined step-up voltage each time, the control circuit being capable of executing reading verify that verifies the data written in the memory cells in the writing sequence, and the control circuit detects characteristic variation of a characteristic that causes disturbance, and determines whether to perform the reading verify based on a result of the detection.

Abstract: A semiconductor memory device includes a memory transistor, a word line, a peripheral circuit, and electrodes connected to the peripheral circuit. In response to a write command via the electrodes, the peripheral circuit can execute a first program operation of applying a first program voltage to the word line one time when the write command is one of an n1-th write command to an n2-th write command corresponding to the memory transistor; and execute a second program operation of applying a second program voltage to the first word line at least one time when the write command is one of an (n2+1)-th write command to an n3-th write command corresponding to the memory transistor. The second program voltage in a k-th second program operation is less than the first program voltage in a k-th first program operation.

Abstract: A semiconductor memory device includes a memory transistor, a word line, a peripheral circuit, and electrodes connected to the peripheral circuit. In response to a write command via the electrodes, the peripheral circuit can execute a first program operation of applying a first program voltage to the word line one time when the write command is one of an n1-th write command to an n2-th write command corresponding to the memory transistor; and execute a second program operation of applying a second program voltage to the first word line at least one time when the write command is one of an (n2+1)-th write command to an n3-th write command corresponding to the memory transistor. The second program voltage in a k-th second program operation is less than the first program voltage in a k-th first program operation.