Abstract: In a tomographic image photographing apparatus, a deformation of a volume image is corrected accurately even if an object to be inspected moves when the volume image is acquired. An image processing apparatus acquires a tomographic image of the object to be inspected from combined light beams of return light beams, which is obtained by irradiating the object to be inspected with a plurality of measuring light beams, and corresponding reference light beams. In the image processing apparatus, a photographing unit obtains a tomographic image of a fundus with the plurality of measuring light beams, and a detection unit detects a retina layer from the tomographic image. Based on the detected retina layer, a fundus shape is estimated. Based on the estimated fundus shape, a positional deviation between tomographic images is corrected.

Abstract: A wafer polishing apparatus configured to polish simultaneously both surfaces of a wafer by pressing and rubbing the wafer, while holding the wafer with: a lower turn table having a flat polishing-upper-surface rotationally driven; an upper turn table having a flat polishing-lower-surface rotationally driven, the upper turn table being arranged with facing to the lower turn table; and a carrier having a wafer-holding bole for holding the wafer, wherein the polishing is performed while measuring a thickness of the wafer through a plurality of openings provided between a rotation center and an edge of the upper turn table or the lower turn table, and switching a polishing slurry with a polishing slurry having a different polishing rate during the polishing of the wafer. As a result, the wafer polishing apparatus can manufacture a wafer having a high flatness and a high smoothness at high productivity and high yield.

Abstract: An information processing apparatus that selects a plurality of feature amounts acquired by applying a filter to learning data and generates a discriminator based on the selected feature amounts includes a time specification unit configured to specify a calculation time required for acquiring a feature amount of a selection candidate by applying the filter to the selected feature amounts or the learning data, a precision specification unit configured to specify a precision of a discriminator generated based on the feature amount of the selection candidate and the selected feature amounts, a selection unit configured to select the feature amount of the selection candidate based on the calculation time and the precision, and a generation unit configured to generate the discriminator based on the selected feature amounts.

Abstract: The present invention is a wafer polishing method including simultaneously polishing both surfaces of a wafer by pressing and rubbing the wafer, while holding the wafer with: a lower turn table having a flat polishing-upper-surface rotationally driven; an upper turn table having a flat polishing-lower-surface rotationally driven, the upper turn table being arranged with facing to the lower turn table; and a carrier having a wafer-holding hole for holding the wafer, wherein the polishing is performed while measuring a thickness of the wafer through a plurality of openings provided between a rotation center and an edge of the upper turn table or the lower turn table, and switching a polishing slurry with a polishing slurry having a different polishing rate during the polishing of the wafer. As a result, there is provided a wafer polishing method that can manufacture a wafer having a high flatness and a high smoothness at high productivity and high yield.

Abstract: An image processing apparatus for supporting imaging diagnosis of an eye is provided. A layer boundary of a retina region is detected from a tomographic image. A position where the detected layer boundary intersects with an upper or lower limit position of the image in the depth direction of the tomographic image is determined as a dividing position. The tomographic image is divided at the determined dividing position by a scan line in the depth direction of the tomographic image. Subsequently, whether the detection is a false detection is judged for each divided region. An average density value of the image outside the retina region according to the detected result is calculated for each divided region, and the detection in the divided region is judged to be a false detection if the average density value is equal to or greater than a predetermined threshold.

Abstract: In a tomographic image photographing apparatus, a deformation of a volume image is corrected accurately even if an object to be inspected moves when the volume image is acquired. An image processing apparatus acquires a tomographic image of the object to be inspected from combined light beams of return light beams, which is obtained by irradiating the object to be inspected with a plurality of measuring light beams, and corresponding reference light beams. In the image processing apparatus, a photographing unit obtains a tomographic image of a fundus with the plurality of measuring light beams, and a detection unit detects a retina layer from the tomographic image. Based on the detected retina layer, a fundus shape is estimated. Based on the estimated fundus shape, a positional deviation between tomographic images is corrected.

Abstract: An image processing apparatus comprising, boundary extraction means for detecting boundaries of retina layers from a tomogram of an eye to be examined, exudate extraction means for extracting an exudate region from a fundus image of the eye to be examined, registration means for performing registration between the tomogram and the fundus image, and calculating a spatial correspondence between the tomogram and the fundus image, specifying means for specifying a region where an exudate exists in the tomogram using the boundaries of the retina layers, the exudate region, and the spatial correspondence, likelihood calculation means for calculating likelihoods of existence of the exudate in association with the specified region, and tomogram exudate extraction means for extracting an exudate region in the tomogram from the specified region using the likelihoods.

Abstract: An image processing apparatus, which analyzes retina layers of an eye to be examined, comprising, means for extracting a feature amount, which represents an anatomical feature in the eye to be examined, from a projection image obtained from a tomogram of the retina layers and a fundus image of the eye to be examined, means for determining a type of the anatomical feature based on the feature amount, means for deciding layers to be detected from the retina layers according to the determined type of the anatomical feature, and detecting structures of the decided layers in the tomogram, and means for modifying the structure of the layer included in a region having the anatomical feature of the structures of the layers detected by the layer structure detection means.

Abstract: An image processing apparatus for supporting imaging diagnosis of an eye is provided. A layer boundary of a retina region is detected from a tomographic image. A position where the detected layer boundary intersects with an upper or lower limit position of the image in the depth direction of the tomographic image is determined as a dividing position. The tomographic image is divided at the determined dividing position by a scan line in the depth direction of the tomographic image. Subsequently, whether the detection is a false detection is judged for each divided region. An average density value of the image outside the retina region according to the detected result is calculated for each divided region, and the detection in the divided region is judged to be a false detection if the average density value is equal to or greater than a predetermined threshold.

Abstract: An image processing unit obtains information indicating continuity of tomograms of a subject's eye, and a determining unit determines the image capturing state of the subject's eye on the basis of the information obtained by the image processing unit.

Abstract: The optical pickup device according to the present invention includes: a light source which emits a first light at a first wavelength, a second light at a second wavelength and a third light at a third wavelength; an optical path combining unit which combines vectors of the first, second and third light emitted by the light source, and matches optical axes of the first light and the third light; a light collection unit which condenses the light from the optical path combining unit into the optical information storage medium; a diffraction element which diffracts reflected light from the optical information storage medium; a first photo detector, a second photo detector and a third photo detector which receives the diffracted light from the first diffraction element; and a prevention unit formed between the first diffraction element and the first photo detector, the second photo detector and the third photo detector, and which prevents irradiation of + first-order diffracted light diffracted by the first diffr

Abstract: An information processing apparatus that selects a plurality of feature amounts acquired by applying a filter to learning data and generates a discriminator based on the selected feature amounts includes a time specification unit configured to specify a calculation time required for acquiring a feature amount of a selection candidate by applying the filter to the selected feature amounts or the learning data, a precision specification unit configured to specify a precision of a discriminator generated based on the feature amount of the selection candidate and the selected feature amounts, a selection unit configured to select the feature amount of the selection candidate based on the calculation time and the precision, and a generation unit configured to generate the discriminator based on the selected feature amounts.

Abstract: The present invention is a wafer polishing method including simultaneously polishing both surfaces of a wafer by pressing and rubbing the wafer, while holding the wafer with: a lower turn table having a flat polishing-upper-surface rotationally driven; an upper turn table having a flat polishing-lower-surface rotationally driven, the upper turn table being arranged with facing to the lower turn table; and a carrier having a wafer-holding hole for holding the wafer, wherein the polishing is performed while measuring a thickness of the wafer through a plurality of openings provided between a rotation center and an edge of the upper turn table or the lower turn table, and switching a polishing slurry with a polishing slurry having a different polishing rate during the polishing of the wafer. As a result, there is provided a wafer polishing method that can manufacture a wafer having a high flatness and a high smoothness at high productivity and high yield.

Abstract: An optical pickup apparatus which carries out recording/reproduction or deletion of information on an optical disc, including a semiconductor laser device in which at least two light sources are integrated, and a hologram optical element which has a plurality of outgoing light areas that divide light reflected from the optical disc, each light being emitted from the semiconductor laser device; the hologram optical element has division lines which divide the outgoing light areas at a position intersecting with each optical axis of the reflected light. The optical pickup apparatus is able to detect a signal corresponding to a light beam divided almost equally in two, even when any one of the plurality of light sources are operating.

Abstract: The optical pickup device according to the present invention includes: a light source which emits a first light at a first wavelength, a second light at a second wavelength and a third light at a third wavelength; an optical path combining unit which combines vectors of the first, second and third light emitted by the light source, and matches optical axes of the first light and the third light; a light collection unit which condenses the light from the optical path combining unit into the optical information storage medium; a diffraction element which diffracts reflected light from the optical information storage medium; a first photo detector, a second photo detector and a third photo detector which receives the diffracted light from the first diffraction element; and a prevention unit formed between the first diffraction element and the first photo detector, the second photo detector and the third photo detector, and which prevents irradiation of + first-order diffracted light diffracted by the first diffr

Abstract: An optical pickup apparatus which carries out recording/reproduction or deletion of information on an optical disc, including a semiconductor laser device in which at least two light sources are integrated, and a hologram optical element which has a plurality of outgoing light areas that divide light reflected from the optical disc, each light being emitted from the semiconductor laser device; the hologram optical element has division lines which divide the outgoing light areas at a position intersecting with each optical axis of the reflected light. The optical pickup apparatus is able to detect a signal corresponding to a light beam divided almost equally in two, even when any one of the plurality of light sources are operating.