Patents by Inventor Daisuke Morioka

Daisuke Morioka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7421631
    Abstract: A semiconductor device includes a signal line, a test load circuit and a termination circuit. The signal line is connected with an input/output node of the semiconductor device. The test load circuit has a test resistor and is provided between the signal line and a first one of power lines to connect the signal line to the first power line through the test resistor in response to a test start signal. The termination circuit has first and second resistors, and is provided between the first power line and a second power line as the other power line to disconnect the signal line from the first and second power lines in response to the test start signal. Also, the test load circuit disconnects the signal line from the first power line in response to a test end signal, and the termination circuit connects the signal line with the first and second power lines through the first and second resistors in response to the test end signal.
    Type: Grant
    Filed: November 29, 2005
    Date of Patent: September 2, 2008
    Assignee: NEC Electronics Corporation
    Inventor: Daisuke Morioka
  • Publication number: 20060107140
    Abstract: A semiconductor device includes a signal line, a test load circuit and a termination circuit. The signal line is connected with an input/output node of the semiconductor device. The test load circuit has a test resistor and is provided between the signal line and a first one of power lines to connect the signal line to the first power line through the test resistor in response to a test start signal. The termination circuit has first and second resistors, and is provided between the first power line and a second power line as the other power line to disconnect the signal line from the first and second power lines in response to the test start signal. Also, the test load circuit disconnects the signal line from the first power line in response to a test end signal, and the termination circuit connects the signal line with the first and second power lines through the first and second resistors in response to the test end signal.
    Type: Application
    Filed: November 29, 2005
    Publication date: May 18, 2006
    Applicant: NEC Electronics Corporation
    Inventor: Daisuke Morioka