Patents by Inventor Daisuke Morishima

Daisuke Morishima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11193099
    Abstract: Provided is a highly reliable temperature adjustment apparatus which uses a temperature adjustment element and quantitatively evaluates the temperature adjustment performance of the temperature adjustment element. The temperature adjustment apparatus is provided with: a temperature adjustment element; one or more temperature detection elements provided near the temperature adjustment element; a calculation unit for calculating the output of the temperature detection element; and a display unit for displaying at least one of a time calculated by the calculation unit as a time at which the temperature adjustment performance of the temperature adjustment is predicted to be below a desired level, the number of operations and the time of current conduction or a warning based on the result of calculation.
    Type: Grant
    Filed: July 27, 2016
    Date of Patent: December 7, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Wataru Sato, Nobuyuki Isoshima, Kohshi Maeda, Daisuke Morishima
  • Patent number: 10815524
    Abstract: The purpose of the invention is to provide a nucleic acid analyzer that sets and executes temperature regulation, said temperature regulation matching the characteristics of analyzing items and the configuration of the analyzer, by a simple operation while preventing deterioration in analytical performance caused by partial overheating of a liquid reaction mixture to thereby improve temperature change speed and shorten analysis time. To achieve the above purpose, provided is a method wherein, in the case of performing overshooting: as a first processing, the temperature is continuously elevated until reaching a target overshoot temperature; as a second processing, after reaching the aforesaid temperature, the overshoot target temperature is maintained for a preset period of time; and, as a third processing, the temperature is continuously lowered until reaching a target temperature of the liquid reaction mixture.
    Type: Grant
    Filed: February 23, 2015
    Date of Patent: October 27, 2020
    Assignee: Hitachi High-Tech Corporation
    Inventors: Manami Nammoku, Terumi Tamura, Kohshi Maeda, Daisuke Morishima, Toshinari Sakurai, Wataru Sato
  • Patent number: 10781440
    Abstract: An automatic analyzer including a function for operating control materials and its operation method are provided. The analyzer is configured to start sampling by giving priority to an entirety of control materials corresponding to all assay items required for measurement. The analyzer is also configured to automatically start sampling of a patient specimen based on a preliminarily set sampling timing after completion of sampling of the entirety of control materials. The analyzer is also configured to stop, when an abnormality is present in a measurement result of at least any one of control materials in the group of control materials, sampling of a patient specimen corresponding to a control material in which the abnormality is found, and notify a tester of the abnormality.
    Type: Grant
    Filed: February 23, 2015
    Date of Patent: September 22, 2020
    Assignee: Hitachi High-Tech Corporation
    Inventors: Kohshi Maeda, Terumi Tamura, Daisuke Morishima
  • Patent number: 10203346
    Abstract: Provided is an automatic analysis device capable of reducing a reagent cost. In the present invention, in each mixed reagent preparation cycle, an amount of mixed reagent for N analyses is mixed and prepared, and an amount of mixed reagent for one analysis is dispensed from the amount of mixed reagent for N analyses and used to analyze one sample. Minimum (Nmin) and maximum (Nmax) values for N are determined for a control unit beforehand, and if the analysis of J samples is requested, the control unit sets the value of N at the time of a mixed reagent preparation cycle within a range from Nmin to Nmax so as to minimize the remaining mixed reagent.
    Type: Grant
    Filed: October 21, 2014
    Date of Patent: February 12, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Daisuke Morishima, Kohshi Maeda
  • Publication number: 20180245031
    Abstract: Provided is a highly reliable temperature adjustment apparatus which uses a temperature adjustment element and quantitatively evaluates the temperature adjustment performance of the temperature adjustment element. The temperature adjustment apparatus is provided with: a temperature adjustment element; one or more temperature detection elements provided near the temperature adjustment element; a calculation unit for calculating the output of the temperature detection element; and a display unit for displaying at least one of a time calculated by the calculation unit as a time at which the temperature adjustment performance of the temperature adjustment is predicted to be below a desired level, the number of operations and the time of current conduction or a warning based on the result of calculation.
    Type: Application
    Filed: July 27, 2016
    Publication date: August 30, 2018
    Inventors: Wataru SATO, Nobuyuki ISOSHIMA, Kohshi MAEDA, Daisuke MORISHIMA
  • Publication number: 20180037930
    Abstract: The purpose of the invention is to provide a nucleic acid analyzer that sets and executes temperature regulation, said temperature regulation matching the characteristics of analyzing items and the configuration of the analyzer, by a simple operation while preventing deterioration in analytical performance caused by partial overheating of a liquid reaction mixture to thereby improve temperature change speed and shorten analysis time. To achieve the above purpose, provided is a method wherein, in the case of performing overshooting: as a first processing, the temperature is continuously elevated until reaching a target overshoot temperature; as a second processing, after reaching the aforesaid temperature, the overshoot target temperature is maintained for a preset period of time; and, as a third processing, the temperature is continuously lowered until reaching a target temperature of the liquid reaction mixture.
    Type: Application
    Filed: February 23, 2015
    Publication date: February 8, 2018
    Inventors: Manami NAMMOKU, Terumi TAMURA, Kohshi MAEDA, Daisuke MORISHIMA, Toshinari SAKURAI, Wataru SATO
  • Publication number: 20180030433
    Abstract: Operation methods for control material conventionally differ in each inspection laboratory, and automatic operation according to laboratory operation standards has been difficult. Further, since operation for control material is complex and devices are operated on the basis of judgments by inspectors in accordance with results of measurement for control materials, highly-trained inspectors have been necessary. The present invention comprises multiple settings for automatically operating a control material in an automated analyzer, and executes an optimal setting according to the test laboratory and inspection items, and also executes an operation process for control material. If there is a possibility of a problem in an inspection process, the control material is automatically re-measured so that wasteful inspection can be prevented and the inspection can be automatically continued.
    Type: Application
    Filed: February 23, 2015
    Publication date: February 1, 2018
    Inventors: Kohshi MAEDA, Terumi TAMURA, Daisuke MORISHIMA
  • Patent number: 9514941
    Abstract: In a TFT substrate, a common signal line is arranged on top of a common electrode and below a pixel electrode through intermediation of an insulating film. The metal piece in a pixel having a bright spot is irradiated with laser from the rear surface side of the TFT substrate. The common electrode and the pixel electrode are short-circuited by the melted metal piece.
    Type: Grant
    Filed: March 6, 2014
    Date of Patent: December 6, 2016
    Assignee: Panasonic Liquid Crystal Display Co., Ltd.
    Inventors: Daisuke Morishima, Keiichirou Ashizawa, Hiroaki Iwato, Takashi Katou
  • Publication number: 20160238624
    Abstract: Provided is an automatic analysis device capable of reducing a reagent cost. In the present invention, in each mixed reagent preparation cycle, an amount of mixed reagent for N analyses is mixed and prepared, and an amount of mixed reagent for one analysis is dispensed from the amount of mixed reagent for N analyses and used to analyze one sample. Minimum (Nmin) and maximum (Nmax) values for N are determined for a control unit beforehand, and if the analysis of J samples is requested, the control unit sets the value of N at the time of a mixed reagent preparation cycle within a range from Nmin to Nmax so as to minimize the remaining mixed reagent.
    Type: Application
    Filed: October 21, 2014
    Publication date: August 18, 2016
    Inventors: Daisuke MORISHIMA, Kohshi MAEDA
  • Patent number: 9347096
    Abstract: A nucleic acid analysis apparatus capable of selecting an optimal analysis method for every user and improving throughput is provided. In a genetic analyzer for measuring and analyzing amplification reaction of a nucleic acid in real time, an amplification curve is analyzed and a user can select conditions for terminating the amplification reaction upon detection of amplification. Further, a user can select conditions for selecting next processing after termination of the amplification reaction. A user can select, in situ, conditions for terminating the amplification reaction and conditions for selecting next processing upon detection of amplification and after the termination of amplification reaction. Alternatively, conditions for terminating the amplification reaction and conditions for selecting the next processing are registered previously and processing is performed automatically upon detection of amplification and after termination of the amplification reaction.
    Type: Grant
    Filed: January 23, 2012
    Date of Patent: May 24, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Daisuke Morishima, Kohshi Maeda, Nobuyoshi Shimane
  • Publication number: 20150153598
    Abstract: In a TFT substrate, a common signal line is arranged on top a common electrode and below a pixel electrode through intermediation of an insulating film. The metal piece in a pixel having a bright spot is irradiated with laser from the rear surface side of the TFT substrate. The common electrode and the pixel electrode are short-circuited by the melted metal piece.
    Type: Application
    Filed: March 6, 2014
    Publication date: June 4, 2015
    Applicant: Panasonic Liquid Crystal Display Co., Ltd.
    Inventors: Daisuke MORISHIMA, Keiichirou ASHIZAWA, Hiroaki IWATO, Takashi KATOU
  • Publication number: 20130316441
    Abstract: A nucleic acid analysis apparatus capable of selecting an optimal analysis method for every user and improving throughput is provided. In a genetic analyzer for measuring and analyzing amplification reaction of a nucleic acid in real time, an amplification curve is analyzed and a user can select conditions for terminating the amplification reaction upon detection of amplification. Further, a user can select conditions for selecting next processing after termination of the amplification reaction. A user can select, in situ, conditions for terminating the amplification reaction and conditions for selecting next processing upon detection of amplification and after the termination of amplification reaction. Alternatively, conditions for terminating the amplification reaction and conditions for selecting the next processing are registered previously and processing is performed automatically upon detection of amplification and after termination of the amplification reaction.
    Type: Application
    Filed: January 23, 2012
    Publication date: November 28, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Daisuke Morishima, Kohshi Maeda, Nobuyoshi Shimane