Patents by Inventor Daisuke SAKAMAKI

Daisuke SAKAMAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test apparatus
    Patent number: 9140749
    Abstract: An existing test head is made best use of and a capital investment is reduced. A test apparatus for testing a plurality of devices under test includes: a plurality of test heads for retaining therein at least one test board to test devices under test; a connecting section mounted on upper surfaces of the plurality of test heads and is independently fixed to each of the plurality of test heads; and a DUT board on which the plurality of devices under test are mounted, the DUT board being mounted to the connecting section, where the at least one test board is mountable and removable through a side surface of each of the plurality of test heads while the connecting section is mounted to the test head.
    Type: Grant
    Filed: January 23, 2012
    Date of Patent: September 22, 2015
    Assignee: ADVANTEST CORPORATION
    Inventors: Daisuke Makita, Mitsuru Fukuda, Daisuke Sakamaki
  • TEST APPARATUS AND TEST METHOD
    Publication number: 20120198292
    Abstract: Provided is a test apparatus that tests a memory under test, comprising a testing integrated circuit device that tests the memory under test and includes an internal memory storing test information including at least one of a test result and test data for a partial memory region of the memory under test; an external memory that stores the test information for an entire memory region of the memory under test; and a memory controller that is connected to the external memory and transmits test information for a memory region of a test target between the external memory and the internal memory. Also provided is a test method.
    Type: Application
    Filed: February 3, 2012
    Publication date: August 2, 2012
    Applicant: ADVANTEST CORPORATION
    Inventors: Akimasa YUZURIHARA, Daisuke MAKITA, Tsuneaki KANAZAWA, Hidekazu NAKAI, Shinichiro YUKAWA, Daisuke SAKAMAKI, Toshihiko ARAI
  • TEST APPARATUS
    Publication number: 20120187973
    Abstract: An existing test head is made best use of and a capital investment is reduced. A test apparatus for testing a plurality of devices under test includes: a plurality of test heads for retaining therein at least one test board to test devices under test; a connecting section mounted on upper surfaces of the plurality of test heads and is independently fixed to each of the plurality of test heads; and a DUT board on which the plurality of devices under test are mounted, the DUT board being mounted to the connecting section, where the at least one test board is mountable and removable through a side surface of each of the plurality of test heads while the connecting section is mounted to the test head.
    Type: Application
    Filed: January 23, 2012
    Publication date: July 26, 2012
    Applicant: ADVANTEST CORPORATION
    Inventors: Daisuke MAKITA, Mitsuru FUKUDA, Daisuke SAKAMAKI