Abstract: A dust collecting device (100) installed inside of an air conduit (51) for collecting airborne particles and for filtrating the air consists of a dust collecting tubes set (1). Said dust collecting tubes set (1) comprises of a plurality of dust collecting tubes (2a-2f) having different diameters. Said tubes (2a-2f) are arranged in a concentric fashion by having a tube with smaller diameter covered by one having larger diameter. Each of said dust collecting tubes (2a-2f) is applied with a layer of adhesive layer (3) for coupling with each other and for adhering particles contained in the air. Each tube of the tube set (1) can be removed from said air conduit (51) by pulling a pull string (4a-4f) provided at two extreme ends of each dust collecting tube (2a-2f).

Abstract: A dust collecting device (100) installed inside of an air conduit (51) for collecting airborne particles and for filtrating the air consists of a dust collecting tubes set (1). Said dust collecting tubes set (1) comprises of a plurality of dust collecting tubes (2a-2f) having different diameters. Said tubes (2a-2f) are arranged in a concentric fashion by having a tube with smaller diameter covered by one having larger diameter. Each of said dust collecting tubes (2a-2f) is applied with a layer of adhesive layer (3) for coupling with each other and for adhering particles contained in the air. Each tube of the tube set (1) can be removed from said air conduit (51) by pulling a pull string (4a-4f) provided at two extreme ends of each dust collecting tube (2a-2f).

Abstract: The invention discloses an analysis method and an analysis system for analyzing an integrated circuit comprising a plurality of electronic components. The analysis method comprises steps of: performing a measurement or a simulation on an integrated circuit to obtain a time-domain waveform of an output signal of the integrated circuit; applying an time-frequency analysis to the time-domain waveform to obtain one or more frequency components; selecting a target frequency component from the one or more frequency components and identifying a point-in-time when an amplitude of the target frequency component changes; from the plurality of electronic components of the integrated circuit, identifying one or more target electronic components under an operating state at the point-in-time. The analysis system comprises a processing module and a memory module.