Patents by Inventor Dal Jo Lee

Dal Jo Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor test interface
    Patent number: 7288949
    Abstract: The present invention relates to a semiconductor test interface for interfacing a DUT (Device Under Test) to a pin card using a cable comprising a DUT board including one or more first connectors for electrically connecting one or more test sockets for mounting the DUT to the one or more cables, and a circuit wiring for electrically connecting the one or more test sockets to the one or more first connectors; and the one more cable including a second connector for an electrical connection to the one or more first connectors, and a third connector for an electrical connection to the pin card, wherein the one or more first connectors correspond to the one or more cables by 1:1. In accordance with the present invention, the manufacturing cost is reduced by simplifying the manufacturing process and the semiconductor test interface may easily correspond to the test of the different DUTs.
    Type: Grant
    Filed: January 27, 2006
    Date of Patent: October 30, 2007
    Assignee: UniTest Inc.
    Inventors: Dae Kyoung Kim, Sun Whan Kim, Dal Jo Lee
  • SEMICONDUCTOR TEST INTERFACE
    Publication number: 20060279305
    Abstract: The present invention relates to a semiconductor test interface for interfacing a DUT (Device Under Test) to a pin card using a cable comprising a DUT board including one or more first connectors for electrically connecting one or more test sockets for mounting the DUT to the one or more cables, and a circuit wiring for electrically connecting the one or more test sockets to the one or more first connectors; and the one more cable including a second connector for an electrical connection to the one or more first connectors, and a third connector for an electrical connection to the pin card, wherein the one or more first connectors correspond to the one or more cables by 1:1. In accordance with the present invention, the manufacturing cost is reduced by simplifying the manufacturing process and the semiconductor test interface may easily correspond to the test of the different DUTs.
    Type: Application
    Filed: January 27, 2006
    Publication date: December 14, 2006
    Applicant: UNITEST INCORPORATION
    Inventors: Dae Kyoung KIM, Sun Whan KIM, Dal Jo LEE