Patents by Inventor Dale Egbert
Dale Egbert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10126326Abstract: Apparatus and associated method that contemplates performing a first atomic force microscope (AFM) scan of a first region of a sample centered at a first position at a first angle to produce a first scan image, the first AFM scan including a first component scan at a first speed and a second component scan at a second speed; performing a second AFM scan of the first region of the sample at a second angle to produce a second scan image, the second AFM scan including performing a third component scan at the first speed and a fourth component scan at the second speed; and correcting a first error in the first scan image based on the second scan image to produce a corrected image output.Type: GrantFiled: October 2, 2015Date of Patent: November 13, 2018Assignee: SEAGATE TECHNOLOGY LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Jonathan A. Nelson, Jianxin Zhu
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Publication number: 20160025772Abstract: Apparatus and associated method that contemplates performing a first atomic force microscope (AFM) scan of a first region of a sample centered at a first position at a first angle to produce a first scan image, the first AFM scan including a first component scan at a first speed and a second component scan at a second speed; performing a second AFM scan of the first region of the sample at a second angle to produce a second scan image, the second AFM scan including performing a third component scan at the first speed and a fourth component scan at the second speed; and correcting a first error in the first scan image based on the second scan image to produce a corrected image output.Type: ApplicationFiled: October 2, 2015Publication date: January 28, 2016Inventors: Lin Zhou, Huiwen Liu, Dale Egbert, Jonathan A. Nelson, Jianxin Zhu
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Patent number: 9150415Abstract: A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.Type: GrantFiled: July 25, 2008Date of Patent: October 6, 2015Assignee: Seagate Technology LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Jonathan A. Nelson, Jianxin Zhu
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Patent number: 8525112Abstract: A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.Type: GrantFiled: August 10, 2010Date of Patent: September 3, 2013Assignee: Seagate Technology LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Peter Gunderson, John Ibele
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Patent number: 8371155Abstract: An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.Type: GrantFiled: August 10, 2010Date of Patent: February 12, 2013Assignee: Seagate Technology LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Peter Gunderson, John Ibele, Cing Siong Ling
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Patent number: 8296860Abstract: An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90° with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated.Type: GrantFiled: March 16, 2009Date of Patent: October 23, 2012Assignee: Seagate Technology LLCInventors: Huiwen Liu, Lin Zhou, Dale Egbert, Jonathan Arland Nelson, Peter Gunderson
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Publication number: 20120042422Abstract: A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.Type: ApplicationFiled: August 10, 2010Publication date: February 16, 2012Applicant: SEAGATE TECHNOLOGY LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Peter Gunderson, John Ibele
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Publication number: 20110138505Abstract: An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.Type: ApplicationFiled: August 10, 2010Publication date: June 9, 2011Applicant: SEAGATE TECHNOLOGY LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Peter Gunderson, John Ibele, Kah Choong Loo, Cing Siong Ling
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Publication number: 20100235956Abstract: An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90° with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated.Type: ApplicationFiled: March 16, 2009Publication date: September 16, 2010Applicant: SEAGATE TECHNOLOGY LLCInventors: Huiwen Liu, Lin Zhou, Dale Egbert, Jonathan Arland Nelson, Peter Gunderson
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Publication number: 20080276696Abstract: A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.Type: ApplicationFiled: July 25, 2008Publication date: November 13, 2008Applicant: SEAGATE TECHNOLOGY LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Jonathan A. Nelson, Jianxin Zhu
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Patent number: 7406860Abstract: A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.Type: GrantFiled: April 28, 2006Date of Patent: August 5, 2008Assignee: Seagate Technology LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Jonathan A. Nelson, Jianxin Zhu
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Publication number: 20070251306Abstract: A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Applicant: Seagate Technology LLCInventors: Lin Zhou, Huiwen Liu, Dale Egbert, Jonathan Nelson, Jianxin Zhu
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Publication number: 20070151094Abstract: A method and apparatus are provided for adjusting recession of an element, such as a pole tip, in a transducer structure formed in a plurality of thin film layers on an edge of a slider. A pre-stressed structure is formed as part of the plurality of thin film layers on the edge of the slider. The pre-stressed structure has a level of material stress. The recession is measured relative to a bearing surface of the slider, and then the level of material stress is adjusted as a function of the measured to effect a corresponding change in the recession.Type: ApplicationFiled: March 13, 2007Publication date: July 5, 2007Applicant: SEAGATE TECHNOLOGY LLCInventors: Youping Mei, Jun Mou, Dale Egbert, Ling Ma
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Publication number: 20060061910Abstract: A sensor comprises a transducer portion including a semi-permanently deformable portion. A deformation of the semi-permanently deformable portion in response to an activation energy deforms the transducer portion. The deformation is retained after the activation energy is removed. In another embodiment of the invention, a transducer comprises a body having an active element, a magnetostrictive element and a magnet having a magnetic field. The magnetic field causes a deformation of the magnetostrictive portion thereby adjusting the position of the active element.Type: ApplicationFiled: November 2, 2005Publication date: March 23, 2006Applicant: Seagate Technology LLCInventors: Jeremy Thurn, Declan Macken, Dale Egbert
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Publication number: 20050047017Abstract: A method and apparatus are provided for adjusting recession of an element, such as a pole tip, in a transducer structure formed in a plurality of thin film layers on an edge of a slider. A pre-stressed structure is formed as part of the plurality of thin film layers on the edge of the slider. The pre-stressed structure has a level of material stress. The recession is measured relative to a bearing surface of the slider, and then the level of material stress is adjusted as a function of the measured to effect a corresponding change in the recession.Type: ApplicationFiled: August 14, 2003Publication date: March 3, 2005Applicant: Seagate Technology LLCInventors: Youping Mei, Jun Mou, Dale Egbert, Ling Ma