Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.

Abstract: A host implement a method for controlling a dynamic transition of the host from a current operation mode to a target operation mode. The method involves the host receiving an operation mode transition request to transition a logical representation of a storage subsystem as maintained by the host from the current operation mode to the target operation mode, and the host reconfiguring the logical representation of the storage subsystem to the target operation mode based on the operation mode transition request exclusive of a re-IPLing of an operating system of the host.

Abstract: An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.

Abstract: Exemplary embodiments of the present invention define PPRC devices within subchannel sets other than subchannel set zero. Further, for all PPRC paired n devices an additional N/2 PPRC primary device numbers and subchannels are provided within subchannel set zero by moving PPRC secondary devices to any subchannel set other than subchannel set zero.

Abstract: I/O measurement data for channels attached to logical control unit queues is obtained related to a plurality of logical control unit queues. A store secondary queue measurement data instruction specifies a range of queues for which extended secondary measurement blocks derived from the I/O measurement data are stored at a memory address specified by the store secondary queue measurement data instruction.

Abstract: An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.

Abstract: Input/output (I/O) communications subadapters, such as subchannels, of an I/O subsystem are dedicated to components, such as I/O devices, of the I/O subsystem. The subadapters provide information about the associated components, in response to the execution of I/O instructions. To enhance I/O connectivity, a plurality of sets of I/O subadapters is provided to an operating system image. This allows programs of the operating system image to access a same component via different sets of I/O communications subadapters. Further, it enables an operating system image to use more than 64 k subchannels.

Abstract: I/O measurement data associated with the performance of an I/O operation process is gathered during the I/O process. The I/O measurement data is saved in an IRB memory location specified by a test subchannel instruction. An I/O interrupt signals the completion of the I/O operation process.

Abstract: An input/output subsystem is configured as a plurality of input/output subsystem images, each of which appears to a program as an independent input/output subsystem. One or more input/output subsystem images of the plurality of input/output subsystem images are managed. An aspect of this management includes managing an input/output (I/O) configuration of an input/output subsystem image. This management may be performed dynamically.

Abstract: Input/output (I/O) measurement facilities are provided. An extended I/O measurement block facility is provided that enables measurement blocks to be stored in discontiguous areas of main storage and to be accessed directly via addresses. In a further aspect, an extended I/O measurement word facility is provided that facilitates the obtaining of measurement data for single I/O operations.