Patents by Inventor Dalju Nakano

Dalju Nakano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel
    Patent number: 7091738
    Abstract: An inspection system for inspecting characteristics of an active matrix panel before formation of OLEDs includes: a roller contact probe having a conductive material on at least a surface thereof and sequentially contacting pixel electrodes formed on the active matrix panel while rotating; probe control circuits having capability to apply a voltage necessary for measurement to TFT arrays including pixel electrodes with which the roller contact probe is in contact; and a computer measuring currents flowing through the TFT arrays to which a voltage is applied and statistically processing the measurement results.
    Type: Grant
    Filed: July 29, 2004
    Date of Patent: August 15, 2006
    Assignee: International Business Machines Corporation
    Inventors: Dalju Nakano, Yoshitami Sakaguchi
  • Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel
    Publication number: 20050088198
    Abstract: An inspection system for inspecting characteristics of an active matrix panel before formation of OLEDs includes: a roller contact probe having a conductive material on at least a surface thereof and sequentially contacting pixel electrodes formed on the active matrix panel while rotating; probe control circuits having capability to apply a voltage necessary for measurement to TFT arrays including pixel electrodes with which the roller contact probe is in contact; and a computer measuring currents flowing through the TFT arrays to which a voltage is applied and statistically processing the measurement results.
    Type: Application
    Filed: July 29, 2004
    Publication date: April 28, 2005
    Inventors: Dalju Nakano, Yoshitami Sakaguchi