Abstract: A protection device (100) and a method for protecting an area detector (200) against collision with an object (10). The protection device (100) is designed to be mountable on the area detector (200) and includes a mounting frame (120) configured to be mounted on the area detector (200) to be protected, wherein the mounting frame (120) is designed to at least partially cover a perimeter rim surface of the area detector (200) to be protected; a first sensor unit arranged on the mounting frame (120) and a light curtain (147, 148) configured to detect and signal a potential collision of the object (10) is provided at an inner area of the area detector (200) surrounded by the mounting frame. A second sensor unit is arranged on the mounting frame (120) and included at least one sensor configured to detect and signal a potential collision of the object (10) at a perimeter rim area of the area detector (200). Further provided is an X-ray detector system and X-ray analysis system including the protection device (100).

Abstract: An X-ray detector includes at least two X-ray detector modules which are articulately connected to one another; a drive mechanism configured to position the at least two articulately connected X-ray modules around the sample; a control unit configured to control the drive mechanism to move the at least two detector modules relative to one another such that the at least two detector modules are arranged around the sample along a pre-calculated curved line having a curvature that depends on a selected distance between the detector and the sample. Also provided is an X-ray analysis system comprising the above X-ray detector and a method of controlling the X-ray detector.

Abstract: An X-ray diffraction system includes an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays. The apparatus may include a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.

Abstract: A protection device (100) and a method for protecting an area detector (200) against collision with an object (10). The protection device (100) is designed to be mountable on the area detector (200) and includes a mounting frame (120) configured to be mounted on the area detector (200) to be protected, wherein the mounting frame (120) is designed to at least partially cover a perimeter rim surface of the area detector (200) to be protected; a first sensor unit arranged on the mounting frame (120) and a light curtain (147, 148) configured to detect and signal a potential collision of the object (10) is provided at an inner area of the area detector (200) surrounded by the mounting frame. A second sensor unit is arranged on the mounting frame (120) and included at least one sensor configured to detect and signal a potential collision of the object (10) at a perimeter rim area of the area detector (200). Further provided is an X-ray detector system and X-ray analysis system including the protection device (100).

Abstract: An X-ray detector includes at least two X-ray detector modules which are articulately connected to one another; a drive mechanism configured to position the at least two articulately connected X-ray modules around the sample; a control unit configured to control the drive mechanism to move the at least two detector modules relative to one another such that the at least two detector modules are arranged around the sample along a pre-calculated curved line having a curvature that depends on a selected distance between the detector and the sample. Also provided is an X-ray analysis system comprising the above X-ray detector and a method of controlling the X-ray detector.

Abstract: An X-ray diffraction system includes an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays. The apparatus may include a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.

Abstract: An electronic circuit for processing electronic measurement data measured by an X-ray detector array being configured for detecting X-rays and having a plurality of detector pixels generating the electronic measurement data in response to X-rays propagating onto the detector array, the electronic circuit comprising a measurement data receiving interface configured for receiving the electronic measurement data from the detector pixels as analog signals, an analog gain adjustment unit configured for manipulating the analog signals in accordance with an adjustable analog gain value, and a processor for processing the electronic measurement data after the manipulation.

Abstract: An X-ray tube for generating an X-ray beam, the X-ray tube comprising a rotatably mounted anode arranged and configured to generate X-rays upon exposure to an electron beam, a hollow space within the anode, a cooling unit configured for cooling the anode by fluid circulation within the hollow space, and a vacuum pump arrangement configured for generating a first vacuum within the hollow space and a second vacuum in a space surrounding the anode, wherein the second vacuum relates to a pressure value being lower than a pressure value relating to the first vacuum, wherein the vacuum pump arrangement comprises a pump arranged for forming a continuous pressure gradient between the first vacuum and the second vacuum.

Abstract: An electron beam emitter for generating an electron beam to be directed towards an anode of an X-ray tube for generating an X-ray beam, wherein the electron beam emitter comprises an electrically conductive tape, made of material capable of emission of electrons, configured to be supplied with electric energy for emitting the electron beam, and a support arrangement configured for mounting the tape under permanent tension.

Abstract: There is provided a method and apparatus for assessing in-situ crystal formation in a test sample. Both optical imaging and X-ray diffraction techniques are utilized, with the results of these processes being combined in such a way as to produce an overall score relating to the aptness of crystalline material for harvesting and subsequent X-ray crystallography.

Abstract: There is provided a method and apparatus for assessing in-situ crystal formation in a test sample. Both optical imaging and X-ray diffraction techniques are utilized, with the results of these processes being combined in such a way as to produce an overall score relating to the aptness of crystalline material for harvesting and subsequent X-ray crystallography.

Abstract: An x-ray diffraction apparatus comprises an x-ray source for generating an x-ray beam, a monochromator for generating a monochromatic x-ray beam from the x-ray beam, and a collimator for collimating the monochromatic x-ray beam and directing it onto a sample, wherein the x-ray source and the monochromator are pre-assembled and fixed with respect to each other in an integrated unit such that in use the path length of the x-ray beam from the source to the monochromator is maintained substantially constant. X-ray flux at the sample is further enhanced by use of a partial monocapillary collimator arranged to direct part of the X-ray beam to the sample by a single grazing reflection.

Abstract: In the present invention, a frame for mounting a fiber optic taper and a CCD chip in optical contact comprises a resilient support for supporting the fiber optic taper adjacent the CCD chip, means for lowering the fiber optic taper towards the CCD chip and means for applying pressure to urge the fiber optic taper onto the CCD chip. The weight of the fiber optic taper is supported by the resilient support as it is lowered into contact with the chip. Once in engagement with the CCD chip, the fiber optic taper can be pressed against the CCD chip to provide a positive pressure in excess of that due to its weight. As the support is resilient, it provides resistance to the positive pressure, thereby preventing the pressure on the CCD chip from becoming great enough to cause damage to the fragile CCD chip.

Abstract: The present invention provides a high flux X-ray source 100 comprising a sealed X-ray tube contained within an X-ray shield (101), an optic housing 103 containing a multi-layer optic for collecting and focussing X-rays generated in the sealed X-ray tube, and an X-ray beam conditioner 104. The multi-layer optic 103 is located at a predetermined distance from the sealed X-ray tube 101, with the optic housing 103 being adjustable relative to the sealed X-ray tube 101 and the beam conditioner 104 adjustable relative to the optic housing 103. The use of a multi-layer optic provides for the efficient collection and focussing of X-rays generated in a compact sealed tube and wavelength selectively enables it to act as a monochromator, providing a beam of X-rays with a predetermined range of photon energy.

Abstract: In the present invention, a frame for mounting a fibre optic taper and a CCD chip in optical contact comprises a resilient support for supporting the fibre optic taper adjacent the CCD chip, means for lowering the fibre optic taper towards the CCD chip and means for applying pressure to urge the fibre optic taper onto the CCD chip. The weight of the fibre optic taper is supported by the resilient support as it is lowered into contact with the chip. Once in engagement with the CCD chip, the fibre optic taper can be pressed against the CCD chip to provide a positive pressure in excess of that due to its weight. As the support is resilient, it provides resistance to the positive pressure, thereby preventing the pressure on the CCD chip from becoming great enough to cause damage to the fragile CCD chip.

Abstract: An x-ray diffraction apparatus comprises an x-ray source for generating an x-ray beam, a monochromator for generating a monochromatic x-ray beam from the x-ray beam, and a collimator for collimating the monochromatic x-ray beam and directing it onto a sample, wherein the x-ray source and the monochromator are pre-assembled and fixed with respect to each other in an integrated unit such that in use the path length of the x-ray beam from the source to the monochromator is maintained substantially constant. X-ray flux at the sample is further enhanced by use of a partial monocapillary collimator arranged to direct part of the X-ray beam to the sample by a single grazing reflection.

Abstract: An open flow cryostat for cooling a sample in use comprises a supply (1) for supplying a coolant, an outlet (2) for directing a flow of the coolant towards the sample, a supply line (3) for transporting coolant from the supply to the outlet and an isolation line (5) arranged to transport at least some of the coolant away from the outlet. The isolation line (5) is positioned in contact with at least a portion of the supply line (3) to thermally isolate the supply line (3) from the surroundings.

Abstract: An open flow cryostat for cooling a sample in use comprises a supply (1) for supplying a coolant, an outlet (2) for directing a flow of the coolant towards the sample, a supply line (3) for transporting coolant from the supply to the outlet and an isolation line (5) arranged to transport at least some of the coolant away from the outlet. The isolation line (5) is positioned in contact with at least a portion of the supply line (3) to thermally isolate the supply line (3) from the surroundings.