Patents by Inventor Damir Shakirov

Damir Shakirov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250155853
    Abstract: A method is for providing a process parameter model for parameterizing one or more process steps of a production process for manufacturing a component includes providing a quality model for determining a quality. The quality model is configured to specify the quality of the resulting component directly or with the aid of a predefined quality function based on one or more predefined measurement variables and/or one or more predefined state variables, which each specify a property of a pre-product or intermediate product of the component being manufactured and/or a production device for performing a process step and/or at least one environmental condition, and based on one or more process parameters which control a corresponding one of the process steps. The method further includes training a data-based process parameter model to output one or more process parameters based on one or more measurement variables captured by a sensor.
    Type: Application
    Filed: January 23, 2023
    Publication date: May 15, 2025
    Inventors: Simon Baeuerle, Damir Shakirov, Andreas Steimer
  • Publication number: 20240379466
    Abstract: A method for providing wafer test data of at least one wafer with semiconductor chips, in particular for providing a training data set for a machine learning algorithm for anomaly detection, comprising receiving a set of measured variables from the semiconductor chips of the wafer, defining sub-areas on the wafer, each of which comprises a plurality of semiconductor chips of the wafer for which measured variables have been received, and outputting a reduced set of measured variables compared to the received set of measured variables, which comprises only the measured variables of subsets of the semiconductor chips of the respective sub-areas.
    Type: Application
    Filed: May 9, 2024
    Publication date: November 14, 2024
    Inventors: Timo Pfrommer, Anton Iakovlev, Damir Shakirov, David Schoenleber, Joseph Trotta, Keng Chai, Mehul Bansal
  • Patent number: 12109642
    Abstract: A method for resistance welding includes performing a plurality of resistance welding processes during which welding electrodes are pressed against respective welding spots of respective workpieces. The welding electrodes are energized with a respective welding current for each of the plurality of resistance welding processes, and for each of the plurality of resistance welding processes, a respective at least one characteristic value that characterizes a quality of the welding is determined. A statistical analysis of the determined at least one characteristic value for each of the plurality of resistance welding processes is performed, and based upon the analysis, an adaptation of the prescribed welding parameters is determined.
    Type: Grant
    Filed: March 12, 2021
    Date of Patent: October 8, 2024
    Assignee: Robert Bosch GmbH
    Inventors: Baifan Zhou, Damir Shakirov, Fabian Bleier, Juergen Haeufgloeckner, Martin Dieterle, Sean McConnell, Sinisa Slavnic, Tim Pychynski
  • Publication number: 20240280626
    Abstract: A computer-implemented method for optimizing a detection threshold of a prediction model used to determine an anomaly of a component is disclosed. The detection threshold indicates the criterion above which the prediction model classifies a component as anomalous.
    Type: Application
    Filed: February 16, 2024
    Publication date: August 22, 2024
    Inventors: Daniel Zander, Anton Iakovlev, Damir Shakirov, David Schoenleber, Erin Sebastian Schmidt, Jonas Bergdolt, Jonathan Levin, Matthias Werner, Stefan Patrick Lindt, Timo Pfrommer, Uwe Lehmann
  • Publication number: 20240170095
    Abstract: A method for determining an assignment rule in order to merge gene expression profiles which are very similar is disclosed. The method includes (i) adjusting a model, e.g. a linear regression model, using the model to predict the gene expression profiles, (ii) calculating a cost matrix from the predictions, and (iii) applying the Hungarian algorithm to the cost matrix to obtain a new assignment rule and repeating these steps several times.
    Type: Application
    Filed: November 12, 2023
    Publication date: May 23, 2024
    Inventors: Christopher Juerges, Damir Shakirov
  • Publication number: 20210316388
    Abstract: A method for resistance welding includes performing a plurality of resistance welding processes during which welding electrodes are pressed against respective welding spots of respective workpieces. The welding electrodes are energized with a respective welding current for each of the plurality of resistance welding processes, and for each of the plurality of resistance welding processes, a respective at least one characteristic value that characterizes a quality of the welding is determined. A statistical analysis of the determined at least one characteristic value for each of the plurality of resistance welding processes is performed, and based upon the analysis, an adaptation of the prescribed welding parameters is determined.
    Type: Application
    Filed: March 12, 2021
    Publication date: October 14, 2021
    Inventors: Baifan Zhou, Damir Shakirov, Fabian Bleier, Juergen Haeufgloeckner, Martin Dieterle, Sean McConnell, Sinisa Slavnic, Tim Pychynski