Patents by Inventor Damon Heer

Damon Heer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for ex situ analysis of a substrate
    Patent number: 8884247
    Abstract: A method and system for creating an asymmetrical lamella for use in an ex situ TEM, SEM, or STEM procedure is disclosed. The shape of the lamella provides for easy orientation such that a region of interest in the lamella can be placed over a hole in a carbon film providing minimal optical and spectral interference from the carbon film during TEM, SEM, or STEM procedure of chemical analysis.
    Type: Grant
    Filed: September 25, 2012
    Date of Patent: November 11, 2014
    Assignee: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Damon Heer, Michael Strauss, Gerardus Nicolaas Anne van Veen
  • System and Method for Ex Situ Analysis of a Substrate
    Publication number: 20140084157
    Abstract: A method and system for creating an asymmetrical lamella for use in an ex situ TEM, SEM, or STEM procedure is disclosed. The shape of the lamella provides for easy orientation such that a region of interest in the lamella can be placed over a hole in a carbon film providing minimal optical and spectral interference from the carbon film during TEM, SEM, or STEM procedure of chemical analysis.
    Type: Application
    Filed: September 25, 2012
    Publication date: March 27, 2014
    Applicant: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Damon Heer, Michael Strauss, Gerardus Nicolaas Anne van Veen