Abstract: The present application relates to a flash memory controller and a method of operating thereof. A system bus interface is provided to interface with a system bus and a debug bus interface is provided to interface with a debug bus. A flash access control block is provided to perform storage I/O operations on a flash memory array. A debug control block is provided to monitor debug related information. The flash memory controller is configured to selectively operate in one or storage operating mode or debug operating mode. In the debug operating mode: the storage control block is configured to serve only read data access requests; and the debug control block is configured to store trace messages in an allocated part of the storage resources of the flash memory controller in response to trace events. The trace messages are generated on the basis of the monitored debug related information.

Abstract: Electronic device packages and related fabrication methods are provided. An exemplary electronic device includes a semiconductor die having debug circuitry fabricated thereon, a framing structure including an interior portion having the semiconductor die mounted thereto, and a conductive element providing an electrical connection between the interior portion and a contact pad on the semiconductor die that corresponds or is otherwise coupled to an interface of the debug circuitry.

Abstract: The present application relates to a flash memory controller and a method of operating thereof. A system bus interface is provided to interface with a system bus and a debug bus interface is provided to interface with a debug bus. A flash access control block is provided to perform storage I/O operations on a flash memory array. A debug control block is provided to monitor debug related information. The flash memory controller is configured to selectively operate in one or storage operating mode or debug operating mode. In the debug operating mode: the storage control block is configured to serve only read data access requests; and the debug control block is configured to store trace messages in an allocated part of the storage resources of the flash memory controller in response to trace events. The trace messages are generated on the basis of the monitored debug related information.

Abstract: Electronic device packages and related fabrication methods are provided. An exemplary electronic device includes a semiconductor die having debug circuitry fabricated thereon, a framing structure including an interior portion having the semiconductor die mounted thereto, and a conductive element providing an electrical connection between the interior portion and a contact pad on the semiconductor die that corresponds or is otherwise coupled to an interface of the debug circuitry.

Abstract: A method and apparatus for storing trace data within a processing system. The method includes configuring at least one Error Correction Code, ECC, component within the processing system to operate in a trace data storage operating mode, generating trace data at a debug module of the processing system, and conveying the trace data from the debug module to the at least one ECC component for storing in an area of memory used for ECC information.

Abstract: A processing device and a method of executing an instruction sequence are described. The processing device comprises a status register for providing a status word, wherein execution of an instruction by the processing device comprises updating the status word, wherein the instruction sequence comprises a subsequence of one or more selected instructions, and wherein execution of a selected instruction by the processing device further comprises a status check which comprises: providing a set of valid status words; verifying whether the updated status word is in the set of valid status words; and initiating an alert action if the updated status word is not in the set of valid status words.

Abstract: A processing device and a method of executing an instruction sequence are described. The processing device comprises a status register for providing a status word, wherein execution of an instruction by the processing device comprises updating the status word, wherein the instruction sequence comprises a subsequence of one or more selected instructions, and wherein execution of a selected instruction by the processing device further comprises a status check which comprises: providing a set of valid status words; verifying whether the updated status word is in the set of valid status words; and initiating an alert action if the updated status word is not in the set of valid status words.

Abstract: A method and apparatus for storing trace data within a processing system. The method comprises configuring at least one Error Correction Code, ECC, component within the processing system to operate in a trace data storage operating mode, generating trace data at a debug module of the processing system, and conveying the trace data from the debug module to the at least one ECC component for storing in an area of memory used for ECC information.

Abstract: An input circuit (20) and a method for protecting the input circuit (20) from positive and negative overvoltages. The input circuit (20) includes an N-channel Metal Oxide Semiconductor Field Effect Transistor (MOSFET) (12), a P-channel MOSFET (13), a Zener diode (21), and a diode-connected transistor (22). The P-channel MOSFET (13) protects the N-channel MOSFET (12) from negative overvoltages. The Zener diode (21) and the diode-connected transistor (22) protect the N-channel MOSFET (12) from positive overvoltages. In addition, the Zener diode (21) protects the P-channel MOSFET (13) from positive overvoltages.