Patents by Inventor Dan Bockelman

Dan Bockelman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for critical node filtering of integrated circuits
    Patent number: 8019585
    Abstract: Systems, apparatuses, methods, and computer program products for performing silicon debugging and isolating faults in integrated circuits are disclosed. Some embodiments comprise a simulator to simulate operation of one or more portions of a circuit in order to identify elements of the circuit which are related to a fault, a circuit pruner to separate the related elements from other elements of the circuit and correlate the related elements to a physical layout of the elements, and a probe tool to locate one or more of the related elements which cause or contribute to the fault. Alternative embodiments may comprise computer programs for simulating operation of a circuit to determine related elements of a fault, correlating the related elements to a physical layout or arrangement of the elements in the circuit, and testing the related elements via the physical layout to determine which elements contribute to the fault.
    Type: Grant
    Filed: September 26, 2007
    Date of Patent: September 13, 2011
    Assignee: Intel Corporation
    Inventors: Md. Asifur Rahman, Dan Bockelman
  • Systems and methods for critical node filtering of integrated circuits
    Publication number: 20090083600
    Abstract: Systems, apparatuses, methods, and computer program products for performing silicon debugging and isolating faults in integrated circuits are disclosed. Some embodiments comprise a simulator to simulate operation of one or more portions of a circuit in order to identify elements of the circuit which are related to a fault, a circuit pruner to separate the related elements from other elements of the circuit and correlate the related elements to a physical layout of the elements, and a probe tool to locate one or more of the related elements which cause or contribute to the fault. Alternative embodiments may comprise computer programs for simulating operation of a circuit to determine related elements of a fault, correlating the related elements to a physical layout or arrangement of the elements in the circuit, and testing the related elements via the physical layout to determine which elements contribute to the fault.
    Type: Application
    Filed: September 26, 2007
    Publication date: March 26, 2009
    Inventors: Asifur Rahman, Dan Bockelman