Abstract: An improved process is described for depositing TiW/TiWN/TiW/Au metallization which provides superior adhesion properties, excellent barrier properties and which is suitable for use with metal line widths of the order of one micron or smaller. It is important in order to obtain these properties to ensure that the layer immediately underlying the gold layer by substantially pure TiW deposited in a nitrogen free sputtering atmosphere. To this end, the gas supply manifolds and deposition chamber are purged and the chamber evacuated following deposition of the TiW layer and prior to deposition of the TiWN layer underlying the gold layer. A final TiW layer is also conveniently placed on top of the gold layer to act as an etching mask.

Abstract: Semiconductor devices with resistor regions, capable of operating at higher temperatures, and having improved bond pull strength are obtained by using a single layer (e.g. Ni--Cr) to act as a combined resistive layer and barrier layer. When placed in the contact windows between the semiconductor (e.g. Si) and the interconnect metallization, (e.g. Al) the Ni--Cr layer acts as a diffusion barrier to prevent interdiffusion of silicon and aluminum and contact alloying punch-through. When placed elsewhere on the device the Ni--Cr layer also serves as thin film resistor material. Wire bond pull strength is improved by placing an adhesion layer (e.g. polysilicon) beneath the portion of the resistive barrier layer underlying the bonding pads. The polysilicon layer rests on the insulator (e.g. SiO.sub.2) covering the semiconductor substrate.

Abstract: Semiconductor devices with resistor regions, capable of operating at higher temperatures, and having improved bond pull strength are obtained by using a single layer (e.g. Ni--Cr) to act as a combined resistive layer and barrier layer. When placed in the contact windows between the semiconductor (e.g. Si) and the interconnect metallization, (e.g. Al) and Ni--Cr layer acts as a diffusion barrier to prevent interdiffusion of silicon and aluminum and contact alloying punch-through. When placed elsewhere on the device the Ni--Cr layer also serves as thin film resistor material. Wire bond pull strength is improved by placing an adhesion layer (e.g. polysilicon) beneath the portion of the resistive barrier layer underlying the bonding pads. The polysilicon layer rests on the insulator (e.g. SiO.sub.2) covering the semiconductor substrate.

Abstract: The present invention is directed to a method for forming a thin silicon dioxide deposited layer on a semiconductor structure. The silicon dioxide layer is formed in a hot wall furnace typically used for diffusions. A convenient temperature is selected from those which are suitable for decomposing the TEOS source of the silicon dioxide into its constituent parts out of which the silicon dioxide layer is formed. A vacuum is used to pull the TEOS gas through the diffusion tube. Care is exercised to assure that the flow of the TEOS material through the diffusion tube is kept at a constant rate. Prior to the first use of a new TEOS source bottle, the bottle is placed in a vacuum at least low enough to complete the boiling of impurities from the source material. This predeposition vacuum step is calculated to remove all the impurities contained in the source bottle and caused by the in situ decomposition of the source material during transit and storage.