Patents by Inventor Dan Strellis

Dan Strellis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160341847
    Abstract: The present specification describes security systems for screening threats contained on persons, and more specifically, to an integrated detection system that is highly portable and that employs Enhanced Metal Detection (EMD) along with Advanced Imaging Technology (using backscatter X-ray scanning) to achieve Automated Threat Recognition (ATR) improvements. In particular, the present specification describes a modular inspection system for detecting objects carried by or on a human subject that includes a plurality of sections having an X-ray source, two backscatter X-ray detector panels and at least one metal detector panel; a first strapping means to hold together two of the plurality of sections that are folded and form a portable first case; and a second strapping means to hold together two of the plurality of sections that are folded and form a portable second case such that the first and second cases can be wheeled to and from a checkpoint.
    Type: Application
    Filed: July 15, 2013
    Publication date: November 24, 2016
    Applicant: Rapiscan Systems, Inc.
    Inventors: Luis E. Arroyo, Jr., Dan Strellis, Willem G. J. Langeveld
  • Publication number: 20160223706
    Abstract: The present specification discloses methods for inspecting liquids, aerosols and gels (LAGs) for threats. The method includes scanning LAGs packed in plastic bags in a multiple step process. In a primary scan, the bag is scanned using dual energy CT technique with fan beam radiation. In case of an alarm, the alarming LAG container is scanned again using coherent X-ray scatter technique with cone beam radiation. The system has a mechanism to switch between two collimators to produce either fan beam or cone beam. The system also has a mechanism to position the target properly for scanning and prevent container overlap when scanning multiple LAG containers in a bag.
    Type: Application
    Filed: January 14, 2016
    Publication date: August 4, 2016
    Inventors: Edward D. Franco, Willem G.J. Langeveld, Joseph Bendahan, Martin Janecek, Dan Strellis
  • Patent number: 9218933
    Abstract: An inspection system for scanning cargo and vehicles is described which employs an X-ray source that includes an electron beam generator, for generating an electron beam; an accelerator for accelerating said electron beam in a first direction; and, a first set of magnetic elements for transporting said electron beam into a magnetic field created by a second set of magnetic elements, wherein the magnetic field created by said second set of magnetic elements causes said electron beam to strike a target such that the target substantially only generates X-rays focused toward a high density section in the scanned object, which is estimated in a second pulse using image data captured by a detector array in a first pulse. The electron beam direction is optimized by said X-ray source during said second pulse to focus X-rays towards said high density section based on said image data in said first pulse.
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: December 22, 2015
    Assignee: Rapidscan Systems, Inc.
    Inventors: Willem Gerhardus Johannes Langeveld, Joseph Bendahan, Tsahi Gozani, Michael King, Dan Strellis, Edward Franco, Krystal R. Alfonso
  • Publication number: 20150325401
    Abstract: An inspection system for scanning cargo and vehicles is described which employs an X-ray source that includes an electron beam generator, for generating an electron beam; an accelerator for accelerating said electron beam in a first direction; and, a first set of magnetic elements for transporting said electron beam into a magnetic field created by a second set of magnetic elements, wherein the magnetic field created by said second set of magnetic elements causes said electron beam to strike a target such that the target substantially only generates X-rays focused toward a high density section in the scanned object, which is estimated in a second pulse using image data captured by a detector array in a first pulse. The electron beam direction is optimized by said X-ray source during said second pulse to focus X-rays towards said high density section based on said image data in said first pulse.
    Type: Application
    Filed: September 19, 2014
    Publication date: November 12, 2015
    Inventors: Willem Gerhardus Johannes Langeveld, Joseph Bendahan, Tsahi Gozani, Michael King, Dan Strellis, Edward Franco, Krystal R. Alfonso