Abstract: Some embodiments of the present invention provide a system for in-situ characterization of a solid-state light. First, a voltage and a current of the solid-state light source are monitored. Then, the health of the solid-state light source is characterized based on an analysis of the monitored voltage and current.

Abstract: One embodiment provides a system that analyzes an electrical connection in a computer system. During operation, the system monitors a reflection coefficient associated with the electrical connection and applies a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient. Next, the system assesses the integrity of the electrical connection based on the statistical deviation of the reflection coefficient. Finally, the system uses the assessed integrity to maintain the electrical connection.

Abstract: A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.

Abstract: A method of quantifying a shape of a surface includes measuring an elevation (z) of the surface at a plurality of locations in an x-y plane of the surface. The measurement data is fit to a series expansion in terms of one or more base functions that include a series expansion fit. A vector of shape coefficients are calculated from the series expansion fit. A vector of shape coefficients are output.

Abstract: Some embodiments of the present invention provide a system that characterizes a response of a device in a computer system to vibration over a frequency range. During operation, the device is vibrated at each frequency in a set of frequencies in the frequency range, wherein the device is vibrated at each frequency, one frequency at a time, until a stabilized response of the device is determined. The response of the device to vibration over the frequency range is then characterized based on information related to the stabilized response at each frequency in the set of frequencies.

Abstract: A system that detects multiple anomalies in a cluster of components is presented. During operation, the system monitors derivatives obtained from one or more inferential variables which are received from sensors in the cluster of components. The system then determines whether one or more components within the cluster have experienced an anomalous event based on the monitored derivatives. If so, the system performs one or more remedial actions.

Abstract: One embodiment provides a system that analyzes an electrical connection in a computer system. During operation, the system monitors a reflection coefficient associated with the electrical connection and applies a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient. Next, the system assesses the integrity of the electrical connection based on the statistical deviation of the reflection coefficient. Finally, the system uses the assessed integrity to maintain the electrical connection.

Abstract: A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.

Abstract: Some embodiments of the present invention provide a system for in-situ characterization of a solid-state light. First, a voltage and a current of the solid-state light source are monitored. Then, the health of the solid-state light source is characterized based on an analysis of the monitored voltage and current.

Abstract: One embodiment of the present invention provides a system that performs a real-time root-cause-analysis for a degradation event associated with a component under test. During operation, the system monitors a telemetry signal collected from the component, and while doing so, attempts to detect an anomaly in the telemetry signal. If an anomaly is detected in the telemetry signal, the system performs a failure analysis on the telemetry signal in real-time while the telemetry signal is degrading. Next, the system identifies a failure mechanism for the component based on the failure analysis.

Abstract: A system that monitors the health of a computer system is presented. During operation, the system receives a first-difference function for the variance of a time series for a monitored telemetry variable within the computer system. The system then determines whether the first-difference function indicates that the computer system is at the onset of degradation. If so, the system performs a remedial action.

Abstract: Some embodiments of the present invention provide a system that characterizes a response of a device in a computer system to vibration over a frequency range. During operation, the device is vibrated at each frequency in a set of frequencies in the frequency range, wherein the device is vibrated at each frequency, one frequency at a time, until a stabilized response of the device is determined. The response of the device to vibration over the frequency range is then characterized based on information related to the stabilized response at each frequency in the set of frequencies.

Abstract: Some embodiments of the present invention provide a system that determines the reliability of an interconnect. During operation, connectors in the interconnect are categorized into a set of predetermined groups. Next, the reliability for selected groups in the set of predetermined groups is determined. Then, a reliability model for the interconnect is generated based on the selected groups and the reliability of the selected groups to determine the overall reliability of the interconnect.

Abstract: A system that detects multiple anomalies in a cluster of components is presented. During operation, the system monitors derivatives obtained from one or more inferential variables which are received from sensors in the cluster of components. The system then determines whether one or more components within the cluster have experienced an anomalous event based on the monitored derivatives. If so, the system performs one or more remedial actions.

Abstract: A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.

Abstract: A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.

Abstract: A method for quantifying a shape of a surface comprising: measuring an elevation (z) of the surface at a plurality of locations in an x-y plane of the surface comprising measurement data; performing a fit of the measurement data to a series expansion in terms of one or more base functions comprising a series expansion fit; calculating a vector of shape coefficients from the series expansion fit; and outputting the vector of shape coefficients.

Abstract: One embodiment of the present invention provides a system that dynamically adjusts data resolution during proactive-fault-monitoring in a computer system. During operation, the system temporarily stores high-resolution data for a telemetry signal from the computer system in a buffer. The system then generates low-resolution data for the telemetry signal from the high-resolution data. Next, the system monitors the low-resolution data, and while doing so, determines if an anomaly exists in the low-resolution data. If an anomaly exists in the low-resolution data, the system records the high-resolution data from the buffer on a storage device.

Abstract: A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.

Abstract: One embodiment of the present invention provides a system that dynamically adjusts data resolution during proactive-fault-monitoring in a computer system. During operation, the system temporarily stores high-resolution data for a telemetry signal from the computer system in a buffer. The system then generates low-resolution data for the telemetry signal from the high-resolution data. Next, the system monitors the low-resolution data, and while doing so, determines if an anomaly exists in the low-resolution data. If an anomaly exists in the low-resolution data, the system records the high-resolution data from the buffer on a storage device.