Patents by Inventor Dane C. Granicher

Dane C. Granicher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
    Patent number: 7245134
    Abstract: A probe card of a wafer test system includes one or more programmable ICs, such as FPGAs, to provide routing from individual test signal channels to one of multiple probes. The programmable ICs can be placed on a base PCB of the probe card, or on a daughtercard attached to the probe card. With programmability, the PCB can be used to switch limited test system channels away from unused probes. Programmability further enables a single probe card to more effectively test devices having the same pad array, but having different pin-outs for different device options. Reprogrammability also allows test engineers to re-program as they are debugging a test program.
    Type: Grant
    Filed: January 31, 2005
    Date of Patent: July 17, 2007
    Assignee: FormFactor, Inc.
    Inventors: Dane C. Granicher, Roy J. Henson, Charles A. Miller