Patents by Inventor Dang M. Ngo
Dang M. Ngo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 8118042Abstract: The present invention concerns an improved apparatus for cleaning the interior of a liquid handling probe to reduce the amount time and the volume of wash fluid required to clean the probe and minimize carryover of material between different samples. In addition to the probe, the apparatus includes one or more wash fluid reservoirs, a compressed gas supply, one or more pumps, two or more valve-controlled probe lines and a controller for opening and closing the valves and actuating the pump(s) at desired time intervals. The invention further concerns a method of cleaning a liquid handling probe using the claimed apparatus and comprising sequential steps of pumping wash fluid and compressed gas through the probe.Type: GrantFiled: February 27, 2009Date of Patent: February 21, 2012Assignee: Beckman Coulter, Inc.Inventors: Dang M. Ngo, Kinh N. Vo, Paul R. Meyer, Jon P. Lindquist, Alan N. Johnson
-
Publication number: 20090217951Abstract: The present invention concerns an improved apparatus for cleaning the interior of a liquid handling probe to reduce the amount time and the volume of wash fluid required to clean the probe and minimize carryover of material between different samples. In addition to the probe, the apparatus includes one or more wash fluid reservoirs, a compressed gas supply, one or more pumps, two or more valve-controlled probe lines and a controller for opening and closing the valves and actuating the pump(s) at desired time intervals. The invention further concerns a method of cleaning a liquid handling probe using the claimed apparatus and comprising sequential steps of pumping wash fluid and compressed gas through the probe.Type: ApplicationFiled: February 27, 2009Publication date: September 3, 2009Inventors: Dang M. Ngo, Kinh N. Vo, Paul R. Meyer, Jon P. Lindquist, Alan N. Johnson
-
Patent number: 6790413Abstract: A sample presentation unit (SPU) for an automated analyzer is provided. The SPU has a sample rack onload section having an elongated rail, and an onload moving mechanism movable along the rail for moving the sample racks placed on the rail towards a sample rack presentation section. The sample rack presentation section of the SPU has a transfer area connected to the proximal end of the rail of the sample rack onload section for receiving the sample racks from the sample rack onload section, a sample presentation area adjacent to the automated analyzer for presenting sample racks for aspiration, and a presentation moving mechanism movable between the transfer area and the presentation area for moving sample racks from the transfer area to the presentation area for a sample aspiration and subsequently moving the sample racks from the presentation area back to the transfer area after sample aspiration.Type: GrantFiled: May 3, 2001Date of Patent: September 14, 2004Assignee: Beckman Coulter, Inc.Inventors: Dang M. Ngo, Brian D. Wilson, Robert J. Mattila
-
Patent number: 6776961Abstract: A workstation for integrating two or more automated analyzers. The workstation includes a sample rack handler assembly, having a single common sample rack input area for loading sample racks for the two or more automated analyzers, and a sample rack bypass area for passing sample racks to be processed by one of the two or more automated analyzers. The workstation also includes a sample aliquoting assembly, having a sample pipetter station for aliquoting samples into aliquot vessels for processing by another one of the two or more automated analyzers. The workstation further includes an internal shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the sample pipetter station, and an external shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the one of the two or more automated analyzers.Type: GrantFiled: July 23, 2001Date of Patent: August 17, 2004Assignee: Beckman Coulter, Inc.Inventors: Christopher W. Lindsey, George K. Shibata, Songtai Tu, Steven D. Mack, Dang M. Ngo
-
Publication number: 20020164269Abstract: A sample presentation unit (SPU) for an automated analyzer is provided. The SPU has a sample rack onload section having an elongated rail, and an onload moving mechanism movable along the rail for moving the sample racks placed on the rail towards a sample rack presentation section. The sample rack presentation section of the SPU has a transfer area connected to the proximal end of the rail of the sample rack onload section for receiving the sample racks from the sample rack onload section, a sample presentation area adjacent to the automated analyzer for presenting sample racks for aspiration, and a presentation moving mechanism movable between the transfer area and the presentation area for moving sample racks from the transfer area to the presentation area for a sample aspiration and subsequently moving the sample racks from the presentation area back to the transfer area after sample aspiration.Type: ApplicationFiled: May 3, 2001Publication date: November 7, 2002Inventors: Dang M. Ngo, Brian D. Wilson, Robert J. Mattila
-
Publication number: 20020015665Abstract: A workstation for integrating two or more automated analyzers. The workstation includes a sample rack handler assembly, having a single common sample rack input area for loading sample racks for the two or more automated analyzers, and a sample rack bypass area for passing sample racks to be processed by one of the two or more automated analyzers. The workstation also includes a sample aliquoting assembly, having a sample pipetter station for aliquoting samples into aliquot vessels for processing by another one of the two or more automated analyzers. The workstation further includes an internal shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the sample pipetter station, and an external shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the one of the two or more automated analyzers.Type: ApplicationFiled: July 23, 2001Publication date: February 7, 2002Inventors: Christopher W. Lindsey, George K. Shibata, Songtai Tu, Steven D. Mack, Dang M. Ngo
-
Patent number: 6027691Abstract: An automatic chemistry analyzer is provided having a high throughput and a high reliability. The analyzer uses nephelometric and turbimetric analyzers to analyze a wide variety of parameters within liquid samples typically generated in, for example, a large medical testing laboratory. The machine employs a unique probe and stirring rod assembly mounted at a slight angle with one another using rack and pinion assemblies so that the lower end of the probe and the lower end of the stirring rod are in very close proximity to one another. This feature allows the machine to be used in unusually small reaction cuvettes. The analysis machine also includes an onboard control sample so that the machine can be programmed to periodically calibrate its analyzing equipment during the course of normal operation.Type: GrantFiled: August 13, 1998Date of Patent: February 22, 2000Assignee: Beckman Coulter, Inc.Inventors: Richard P. Watts, David L. Goodale, Dang M. Ngo, Songai Tu, Michael Tran, Michael L. Bell
-
Patent number: 5902548Abstract: An automatic chemistry analyzer is provided having a high throughput and a high reliability. The analyzer uses nephelometric and turbimetric analyzers to analyze a wide variety of parameters within liquid samples typically generated in, for example, a large medical testing laboratory. The machine employs a unique probe and stirring rod assembly mounted at a slight angle with one another using rack and pinion assemblies so that the lower end of the probe and the lower end of the stirring rod are in very close proximity to one another. This feature allows the machine to be used in unusually small reaction cuvettes. The analysis machine also includes an onboard control sample so that the machine can be programmed to periodically calibrate its analyzing equipment during the course of normal operation.Type: GrantFiled: August 13, 1998Date of Patent: May 11, 1999Assignee: Beckman Instruments, Inc.Inventors: Richard P. Watts, David L. Goodale, Michael L. Bell, Dang M. Ngo, Songai Tu, Michael Tran
-
Patent number: 5807523Abstract: An automatic chemistry analyzer is provided having a high throughput and a high reliability. The analyzer uses nephelometric and turbimetric analyzers to analyze a wide variety of parameters within liquid samples typically generated in, for example, a large medical testing laboratory. The machine employs a unique probe and stirring rod assembly mounted at a slight angle with one another using rack and pinion assemblies so that the lower end of the probe and the lower end of the stirring rod are in very close proximity to one another. This feature allows the machine to be used in unusually small reaction cuvettes. The analysis machine also includes an onboard control sample so that the machine can be programmed to periodically calibrate its analyzing equipment during the course of normal operation.Type: GrantFiled: July 3, 1996Date of Patent: September 15, 1998Assignee: Beckman Instruments, Inc.Inventors: Richard P. Watts, David L. Goodale, Dang M. Ngo, Songai Tu, Michael Tran, Michael L. Bell