Abstract: A non-invasive imaging system and method for visualizing cranial sutures through overlying tissue are disclosed. The system includes a near-infrared and/or short-wave infrared illumination source, an imaging device that detects reflected short-wave infrared radiation, a linear polarizer, and a long-pass filter arranged in an optical path between a cranial region and the imaging device. The linear polarizer reduces surface-reflected light, and the long-pass filter attenuates wavelengths below a selected cutoff wavelength while passing short-wave infrared light reflected from beneath overlying tissue. Detected short-wave infrared radiation is provided to processing circuitry that generates image data representing cranial suture morphology. The disclosed approach enables evaluation of cranial sutures in the absence of ionizing radiation.