Abstract: Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.

Abstract: Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.

Abstract: A method is provided wherein when an auxiliary device is being powered by the PTO driveline the PTO clutch is periodically slowly ramped down in pressure until slippage is detected in the clutch. Slippage is determined by monitoring the shaft speed into the clutch as well as the shaft speed downstream of the clutch. By determining the commanded pressure where slippage occurred, the equivalent engine power that is going to the auxiliary function is calculated. With this information, the proportion of the engine load signal that is going to the auxiliary function versus the drive wheels is determined. After slip is detected in the PTO clutch, pressure is ramped back up in the clutch so as to minimize the amount of slippage.

Abstract: A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths (240, 242, 244). According to an example embodiment of the present invention, a microcontroller (205) is programmed to monitor input nodes (210) using an interrupt routine for automatically detecting test signals (i.e., digital and/or JTAG test signals). Upon the detection of the test signals, the microcontroller controls a controllable switch (220) for routing the test data along one of the test circuit paths. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible.

Abstract: A centralizer system is provided for use in a marine riser system with an insulated pipe, which may be a titanium stress joint. The centralizer system utilizes one or more centralizers mounted such that insulation material is provided in an annulus between the one or more centralizers and the stress joint. A clamp is utilized to axially affix either one centralizer or multiple centralizers to the stress joint. The clamp is comprised of a plurality of sections with cylindrical interior surfaces which are tightened together using fasteners. The cylindrical interior surfaces avoid damage to the insulation layer which may be elastomeric. The clamp and each centralizer have radially directed projections thereon which interlock the clamp with each centralizer. Because the clamp is axially affixed, the centralizer is then also axially affixed. In one embodiment, the centralizer is axially moveable to a desired axial position prior to being interlocked to the tightened clamp.

Abstract: A circuit testing and control approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, graphical user interface (GUI) (240) includes stored computer-executable code that, when executed, causes a micro-computer circuit to send configuration signals to a microcontroller (220). A configurable circuit (215) coupled to the microcontroller is then configured by the microcontroller, in response to the configuration signals, for routing test signals using controllable switches. In one implementation, the configurable circuit includes circuits on inter-connectable circuit boards (210, 250, 260), with sense nodes for detecting the presence of an inter-connectable circuit board coupled to another. In response to the detected presence (or lack thereof), the controllable switches control the routing of the test signals between the inter-connectable circuit boards.