Patents by Inventor Daniel Bolt

Daniel Bolt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR ESTIMATING EXAMINEE ATTRIBUTE PARAMETERS IN A COGNITIVE DIAGNOSIS MODEL
    Publication number: 20080286742
    Abstract: A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
    Type: Application
    Filed: July 9, 2008
    Publication date: November 20, 2008
    Inventors: Daniel Bolt, Jianbin Fu
  • Method for estimating examinee attribute parameters in a cognitive diagnosis model
    Patent number: 7418458
    Abstract: A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: August 26, 2008
    Assignee: Educational Testing Service
    Inventors: Daniel Bolt, Jianbin Fu
  • Method for estimating examinee attribute parameters in a cognitive diagnosis model
    Publication number: 20050222799
    Abstract: A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
    Type: Application
    Filed: April 6, 2005
    Publication date: October 6, 2005
    Inventors: Daniel Bolt, Jianbin Fu