Patents by Inventor Daniel Bultreys

Daniel Bultreys has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and devices for high throughput crystal structure analysis by electron diffraction
    Patent number: 8253099
    Abstract: A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
    Type: Grant
    Filed: November 6, 2009
    Date of Patent: August 28, 2012
    Assignee: NanoMegas SPRL
    Inventors: Stavros Nicolopoulos, Daniel Bultreys, Edgard Rauch
  • METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS BY ELECTRON DIFFRACTION
    Publication number: 20110220796
    Abstract: A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
    Type: Application
    Filed: November 6, 2009
    Publication date: September 15, 2011
    Applicant: NanoMegas SPRL
    Inventors: Stavros Nicolopoulos, Daniel Bultreys, Edgard Rauch