Patents by Inventor Daniel Colliaux

Daniel Colliaux has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron probe microanalyzer comprising an observation system having double magnification
    Patent number: 4440475
    Abstract: The electromagnetic lens for focusing the analyzing electron beam is provided with a central channel along the axis of the electron beam which is intended to pass through a mirror-objective having high magnification. The electromagnetic lens further comprises a lateral channel in which is placed an auxiliary objective having low magnification. An optical illumination system, the axis of which is contained in the plane of the axes of the objectives, illuminates the sample either through the principal objective or through the auxiliary objective. An orientable mirror which is orthogonal to the plane aforesaid and placed at the intersection of the beams which form the images through the two objectives permits the use of the same observation means both for low magnification and for high magnification.
    Type: Grant
    Filed: January 18, 1982
    Date of Patent: April 3, 1984
    Assignee: Compagnie d'Applications Mecaniques a l'Electronique, au Cinema et a l'Atomistique (C.A.M.E.C.A.)
    Inventor: Daniel Colliaux