Patents by Inventor Daniel E. Adam

Daniel E. Adam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11867626
    Abstract: Apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light. Quantitative images yield spatially-dependent, local material information about a sample of interest. These images may provide material properties such as chemical composition, the thickness of chemical layers, dopant concentrations, mixing between layers of a sample, reactions at interfaces, etc. An incident beam of VUV wavelength or shorter is scattered off of a sample and imaged at various angles, wavelengths, and/or polarizations. The power of beam is also measured. This data is used to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.
    Type: Grant
    Filed: April 12, 2021
    Date of Patent: January 9, 2024
    Assignee: Regents of the Univ of Colorado, a body corporate
    Inventors: Christina Porter, Daniel E. Adams, Michael Tanksalvala, Elisabeth Shanblatt, Margaret M. Murnane, Henry C. Kapteyn
  • Patent number: 11709132
    Abstract: Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.
    Type: Grant
    Filed: May 18, 2017
    Date of Patent: July 25, 2023
    Assignee: Regents of the University of Colorado, a body corporate
    Inventors: Michael Tanksalvala, Daniel E. Adams, Dennis Gardner, Christina L. Porter, Giulia F. Mancini, Margaret M. Murnane, Henry C. Kapteyn
  • Publication number: 20210325301
    Abstract: Apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light. Quantitative images yield spatially-dependent, local material information about a sample of interest. These images may provide material properties such as chemical composition, the thickness of chemical layers, dopant concentrations, mixing between layers of a sample, reactions at interfaces, etc. An incident beam of VUV wavelength or shorter is scattered off of a sample and imaged at various angles, wavelengths, and/or polarizations. The power of beam is also measured. This data is used to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.
    Type: Application
    Filed: April 12, 2021
    Publication date: October 21, 2021
    Inventors: Christina Porter, Daniel E. Adams, Michael Tanksalvala, Elisabeth Shanblatt, Margaret M. Murnane, Henry C. Kapteyn
  • Patent number: 11150139
    Abstract: Apparatus and methods of full spatio-temporal characterization of ultrashort pulses from an input pulse-beam source. An interferometer system generates a first, second, third, and fourth replica of the input pulse-beam such that the second replica has a varying delay with respect to the first replica and the fourth replica has a varying delay with respect to the third replica. A reference plane is imaged onto a nonlinear spectral measurement device based upon the first and second replicas, and the reference plane is also imaged onto a wavefront sensitive (WFS) imaging element based on the third and fourth replicas. The signals from the WFS imaging element and the spectral signal are used to compute a pulse temporal spectral profile of the input pulse-beam.
    Type: Grant
    Filed: March 16, 2020
    Date of Patent: October 19, 2021
    Assignee: Kapteyn Murnane Laboratories, Inc.
    Inventors: Henry C. Kapteyn, Daniel E. Adams, Seth L. Cousin
  • Publication number: 20200292393
    Abstract: Apparatus and methods of full spatio-temporal characterization of ultrashort pulses from an input pulse-beam source. An interferometer system generates a first, second, third, and fourth replica of the input pulse-beam such that the second replica has a varying delay with respect to the first replica and the fourth replica has a varying delay with respect to the third replica. A reference plane is imaged onto a nonlinear spectral measurement device based upon the first and second replicas, and the reference plane is also imaged onto a wavefront sensitive (WFS) imaging element based on the third and fourth replicas. The signals from the WFS imaging element and the spectral signal are used to compute a pulse temporal spectral profile of the input pulse-beam.
    Type: Application
    Filed: March 16, 2020
    Publication date: September 17, 2020
    Inventors: Henry C. Kapteyn, Daniel E. Adams, Seth L. Cousin
  • Publication number: 20190302010
    Abstract: Apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light (121). Quantitative images yield spatially-dependent, local material information about a sample (128, 228) of interest. These images may provide material properties such as chemical composition, the thickness of chemical layers, dopant concentrations, mixing between layers of a sample, reactions at interfaces, etc. An incident beam (123) of VUV wavelength or shorter is scattered off of a sample (128, 228) and imaged at various angles, wavelengths, and/or polarizations. The power of beam (123) is also measured. This data is used to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.
    Type: Application
    Filed: May 18, 2017
    Publication date: October 3, 2019
    Inventors: Christina Porter, Daniel E. Adams, Michael Tanksalvala, Elizabeth Shanblatt, Margaret M. Murnane, Henry C. Kapteyn
  • Publication number: 20190204218
    Abstract: Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.
    Type: Application
    Filed: May 18, 2017
    Publication date: July 4, 2019
    Inventors: Michael Tankslavala, Daniel E. Adams, Dennis Gardner, Christina L. Porter, Giulia F. Mancini, Margaret M. Murnane, Henry C. Kapteyn
  • Patent number: 9911207
    Abstract: Apparatus and methods for Coherent Diffractive Imaging with multiple, simultaneous, spatially distinct beams chosen and configured to isolate incoherent sums of beam diffraction such that interference between the multiple beams is not present in the data prior to computationally reconstructing the image. This is accomplished through selecting the multiple beams to be non-interfering modes, or through designing the apparatus such that the interference is not recorded, or through processing the collected data to filter the interference before reconstructing the image.
    Type: Grant
    Filed: September 5, 2016
    Date of Patent: March 6, 2018
    Assignee: KM Labs, Inc.
    Inventors: Robert M. Karl, Daniel E. Adams, Charles S. Bevis, Henry C. Kapteyn, Margaret M. Murnane
  • Patent number: 9891584
    Abstract: Apparatus and methods for coherent diffractive imaging with arbitrary angle of illumination incidence utilize a method of fast remapping of a detected diffraction intensity pattern from a detector pixel array (initial grid) to a uniform spatial frequency grid (final grid) chosen to allow for FFT on the remapped pattern. This is accomplished by remapping the initial grid to an intermediate grid chosen to result in a final grid that is linear in spatial frequency. The initial grid is remapped (generally by interpolation) to the intermediate grid that is calculated to correspond to the final grid. In general, the initial grid (x,y) is uniform in space, the intermediate grid ({tilde over (x)},{tilde over (y)}) is non-uniform in spatial frequency, and the final grid ({tilde over (f)}x,{tilde over (f)}y) is uniform in spatial frequency.
    Type: Grant
    Filed: August 28, 2015
    Date of Patent: February 13, 2018
    Assignee: The Regents of the University of Colorado, a body
    Inventors: Bosheng Zhang, Matthew D. Seaberg, Daniel E. Adams, Henry C. Kapteyn, Margaret M. Murnane
  • Publication number: 20170069116
    Abstract: Apparatus and methods for Coherent Diffractive Imaging with multiple, simultaneous, spatially distinct beams chosen and configured to isolate incoherent sums of beam diffraction such that interference between the multiple beams is not present in the data prior to computationally reconstructing the image. This is accomplished through selecting the multiple beams to be non-interfering modes, or through designing the apparatus such that the interference is not recorded, or through processing the collected data to filter the interference before reconstructing the image.
    Type: Application
    Filed: September 5, 2016
    Publication date: March 9, 2017
    Inventors: Robert M. Karl, Daniel E. Adams, Charles S. Bevis, Henry C. Kapteyn, Margaret M. Murnane
  • Publication number: 20160187849
    Abstract: Apparatus and methods for coherent diffractive imaging with arbitrary angle of illumination incidence utilize a method of fast remapping of a detected diffraction intensity pattern from a detector pixel array (initial grid) to a uniform spatial frequency grid (final grid) chosen to allow for FFT on the remapped pattern. This is accomplished by remapping the initial grid to an intermediate grid chosen to result in a final grid that is linear in spatial frequency. The initial grid is remapped (generally by interpolation) to the intermediate grid that is calculated to correspond to the final grid. In general, the initial grid (x,y) is uniform in space, the intermediate grid ({tilde over (x)},{tilde over (y)}) is non-uniform in spatial frequency, and the final grid ({tilde over (f)}x,{tilde over (f)}y) is uniform in spatial frequency.
    Type: Application
    Filed: August 28, 2015
    Publication date: June 30, 2016
    Inventors: Bosheng Zhang, Matthew D. Seaberg, Daniel E. Adams, Henry C. Kapteyn, Margaret M. Murnane
  • Patent number: 9260064
    Abstract: An assembly for managing heat and noise generated by an engine comprises a dash panel, an acoustic absorbing layer, a scrim, and a heat reflective coating. The acoustic absorbing layer comprises a plurality of fibers secure in a resin, where the acoustic absorbing layer is positioned proximate to the dash panel. The scrim is positioned proximate to the acoustic absorbing layer. The heat reflective coating comprises a polymer material and heat reflecting additives dispersed in the polymer material. The heat reflective coating is applied to the scrim as a solution of the polymer material and heat reflecting additives.
    Type: Grant
    Filed: November 29, 2012
    Date of Patent: February 16, 2016
    Assignees: Honda Motor Co., Ltd., Lord Corporation
    Inventors: Andrew B. Shives, Negar B. Gilsinger, Michael A. Baumbarger, Rebecca S. Cowles, Daniel E. Adam
  • Patent number: 5114438
    Abstract: An abrasive article comprises abrasive particles bonded to microporous material wherein the microporous material comprises (a) a matrix consisting essentially of thermoplastic organic polymer, (b) a large proportion of finely divided water-insoluble siliceous filler, and (c) a large void volume.
    Type: Grant
    Filed: October 29, 1990
    Date of Patent: May 19, 1992
    Assignee: PPG Industries, Inc.
    Inventors: Dennis D. Leatherman, James J. McGinley, Daniel E. Adams, George A. Brons