Patents by Inventor Daniel E. Adam
Daniel E. Adam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11867626Abstract: Apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light. Quantitative images yield spatially-dependent, local material information about a sample of interest. These images may provide material properties such as chemical composition, the thickness of chemical layers, dopant concentrations, mixing between layers of a sample, reactions at interfaces, etc. An incident beam of VUV wavelength or shorter is scattered off of a sample and imaged at various angles, wavelengths, and/or polarizations. The power of beam is also measured. This data is used to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.Type: GrantFiled: April 12, 2021Date of Patent: January 9, 2024Assignee: Regents of the Univ of Colorado, a body corporateInventors: Christina Porter, Daniel E. Adams, Michael Tanksalvala, Elisabeth Shanblatt, Margaret M. Murnane, Henry C. Kapteyn
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Patent number: 11709132Abstract: Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.Type: GrantFiled: May 18, 2017Date of Patent: July 25, 2023Assignee: Regents of the University of Colorado, a body corporateInventors: Michael Tanksalvala, Daniel E. Adams, Dennis Gardner, Christina L. Porter, Giulia F. Mancini, Margaret M. Murnane, Henry C. Kapteyn
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Publication number: 20210325301Abstract: Apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light. Quantitative images yield spatially-dependent, local material information about a sample of interest. These images may provide material properties such as chemical composition, the thickness of chemical layers, dopant concentrations, mixing between layers of a sample, reactions at interfaces, etc. An incident beam of VUV wavelength or shorter is scattered off of a sample and imaged at various angles, wavelengths, and/or polarizations. The power of beam is also measured. This data is used to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.Type: ApplicationFiled: April 12, 2021Publication date: October 21, 2021Inventors: Christina Porter, Daniel E. Adams, Michael Tanksalvala, Elisabeth Shanblatt, Margaret M. Murnane, Henry C. Kapteyn
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Patent number: 11150139Abstract: Apparatus and methods of full spatio-temporal characterization of ultrashort pulses from an input pulse-beam source. An interferometer system generates a first, second, third, and fourth replica of the input pulse-beam such that the second replica has a varying delay with respect to the first replica and the fourth replica has a varying delay with respect to the third replica. A reference plane is imaged onto a nonlinear spectral measurement device based upon the first and second replicas, and the reference plane is also imaged onto a wavefront sensitive (WFS) imaging element based on the third and fourth replicas. The signals from the WFS imaging element and the spectral signal are used to compute a pulse temporal spectral profile of the input pulse-beam.Type: GrantFiled: March 16, 2020Date of Patent: October 19, 2021Assignee: Kapteyn Murnane Laboratories, Inc.Inventors: Henry C. Kapteyn, Daniel E. Adams, Seth L. Cousin
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Publication number: 20200292393Abstract: Apparatus and methods of full spatio-temporal characterization of ultrashort pulses from an input pulse-beam source. An interferometer system generates a first, second, third, and fourth replica of the input pulse-beam such that the second replica has a varying delay with respect to the first replica and the fourth replica has a varying delay with respect to the third replica. A reference plane is imaged onto a nonlinear spectral measurement device based upon the first and second replicas, and the reference plane is also imaged onto a wavefront sensitive (WFS) imaging element based on the third and fourth replicas. The signals from the WFS imaging element and the spectral signal are used to compute a pulse temporal spectral profile of the input pulse-beam.Type: ApplicationFiled: March 16, 2020Publication date: September 17, 2020Inventors: Henry C. Kapteyn, Daniel E. Adams, Seth L. Cousin
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Publication number: 20190302010Abstract: Apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light (121). Quantitative images yield spatially-dependent, local material information about a sample (128, 228) of interest. These images may provide material properties such as chemical composition, the thickness of chemical layers, dopant concentrations, mixing between layers of a sample, reactions at interfaces, etc. An incident beam (123) of VUV wavelength or shorter is scattered off of a sample (128, 228) and imaged at various angles, wavelengths, and/or polarizations. The power of beam (123) is also measured. This data is used to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.Type: ApplicationFiled: May 18, 2017Publication date: October 3, 2019Inventors: Christina Porter, Daniel E. Adams, Michael Tanksalvala, Elizabeth Shanblatt, Margaret M. Murnane, Henry C. Kapteyn
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Publication number: 20190204218Abstract: Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.Type: ApplicationFiled: May 18, 2017Publication date: July 4, 2019Inventors: Michael Tankslavala, Daniel E. Adams, Dennis Gardner, Christina L. Porter, Giulia F. Mancini, Margaret M. Murnane, Henry C. Kapteyn
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Patent number: 9911207Abstract: Apparatus and methods for Coherent Diffractive Imaging with multiple, simultaneous, spatially distinct beams chosen and configured to isolate incoherent sums of beam diffraction such that interference between the multiple beams is not present in the data prior to computationally reconstructing the image. This is accomplished through selecting the multiple beams to be non-interfering modes, or through designing the apparatus such that the interference is not recorded, or through processing the collected data to filter the interference before reconstructing the image.Type: GrantFiled: September 5, 2016Date of Patent: March 6, 2018Assignee: KM Labs, Inc.Inventors: Robert M. Karl, Daniel E. Adams, Charles S. Bevis, Henry C. Kapteyn, Margaret M. Murnane
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Patent number: 9891584Abstract: Apparatus and methods for coherent diffractive imaging with arbitrary angle of illumination incidence utilize a method of fast remapping of a detected diffraction intensity pattern from a detector pixel array (initial grid) to a uniform spatial frequency grid (final grid) chosen to allow for FFT on the remapped pattern. This is accomplished by remapping the initial grid to an intermediate grid chosen to result in a final grid that is linear in spatial frequency. The initial grid is remapped (generally by interpolation) to the intermediate grid that is calculated to correspond to the final grid. In general, the initial grid (x,y) is uniform in space, the intermediate grid ({tilde over (x)},{tilde over (y)}) is non-uniform in spatial frequency, and the final grid ({tilde over (f)}x,{tilde over (f)}y) is uniform in spatial frequency.Type: GrantFiled: August 28, 2015Date of Patent: February 13, 2018Assignee: The Regents of the University of Colorado, a bodyInventors: Bosheng Zhang, Matthew D. Seaberg, Daniel E. Adams, Henry C. Kapteyn, Margaret M. Murnane
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Publication number: 20170069116Abstract: Apparatus and methods for Coherent Diffractive Imaging with multiple, simultaneous, spatially distinct beams chosen and configured to isolate incoherent sums of beam diffraction such that interference between the multiple beams is not present in the data prior to computationally reconstructing the image. This is accomplished through selecting the multiple beams to be non-interfering modes, or through designing the apparatus such that the interference is not recorded, or through processing the collected data to filter the interference before reconstructing the image.Type: ApplicationFiled: September 5, 2016Publication date: March 9, 2017Inventors: Robert M. Karl, Daniel E. Adams, Charles S. Bevis, Henry C. Kapteyn, Margaret M. Murnane
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Publication number: 20160187849Abstract: Apparatus and methods for coherent diffractive imaging with arbitrary angle of illumination incidence utilize a method of fast remapping of a detected diffraction intensity pattern from a detector pixel array (initial grid) to a uniform spatial frequency grid (final grid) chosen to allow for FFT on the remapped pattern. This is accomplished by remapping the initial grid to an intermediate grid chosen to result in a final grid that is linear in spatial frequency. The initial grid is remapped (generally by interpolation) to the intermediate grid that is calculated to correspond to the final grid. In general, the initial grid (x,y) is uniform in space, the intermediate grid ({tilde over (x)},{tilde over (y)}) is non-uniform in spatial frequency, and the final grid ({tilde over (f)}x,{tilde over (f)}y) is uniform in spatial frequency.Type: ApplicationFiled: August 28, 2015Publication date: June 30, 2016Inventors: Bosheng Zhang, Matthew D. Seaberg, Daniel E. Adams, Henry C. Kapteyn, Margaret M. Murnane
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Patent number: 9260064Abstract: An assembly for managing heat and noise generated by an engine comprises a dash panel, an acoustic absorbing layer, a scrim, and a heat reflective coating. The acoustic absorbing layer comprises a plurality of fibers secure in a resin, where the acoustic absorbing layer is positioned proximate to the dash panel. The scrim is positioned proximate to the acoustic absorbing layer. The heat reflective coating comprises a polymer material and heat reflecting additives dispersed in the polymer material. The heat reflective coating is applied to the scrim as a solution of the polymer material and heat reflecting additives.Type: GrantFiled: November 29, 2012Date of Patent: February 16, 2016Assignees: Honda Motor Co., Ltd., Lord CorporationInventors: Andrew B. Shives, Negar B. Gilsinger, Michael A. Baumbarger, Rebecca S. Cowles, Daniel E. Adam
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Patent number: 5114438Abstract: An abrasive article comprises abrasive particles bonded to microporous material wherein the microporous material comprises (a) a matrix consisting essentially of thermoplastic organic polymer, (b) a large proportion of finely divided water-insoluble siliceous filler, and (c) a large void volume.Type: GrantFiled: October 29, 1990Date of Patent: May 19, 1992Assignee: PPG Industries, Inc.Inventors: Dennis D. Leatherman, James J. McGinley, Daniel E. Adams, George A. Brons