Abstract: An end effector device for use with a scanning electron microscope includes a body defining a shaft extending along a longitudinal axis between a distal end and a proximal end. The proximal end features a bulbous portion, while the distal end has a first aperture aligned with the longitudinal axis, designed to receive a stem of a scanning electron microscope sample holder. The proximal end has a second aperture aligned with the longitudinal axis to receive an extension rod. The body also has a clip aperture, defined as a blind bore extending partially into the shaft, substantially orthogonal to the longitudinal axis. A clip is positioned within the clip aperture, held in place with a pin traversing through a pin aperture, allowing the clip to transition between a stem-engaging and a release configuration. A spring is positioned between the clip and the body to bias the clip to the stem-engaging configuration. The body is 3D printed, starting at the planar proximal end defined by the bulbous portion.

Abstract: A probe assembly for use with a charged particle instrument includes an elongate body having a proximal end for positioning outside of a charged particle instrument enclosed environment, a distal end for positioning within the enclosed environment and a longitudinal axis. A port interface is located on the body between the proximal and distal ends, and is coupleable to a nanomanipulator system of the charged particle instrument. A probe needle is positioned at a distal end of the body and is selectively positionable from outside the enclosed environment to contact a specimen within the enclosed environment. At least one gas injection needle is adjustably positioned near the probe needle. The gas injection needle is connectable to a source of pressurized gas to selectively inject gas in the area of the probe needle within the enclosed environment.

Abstract: A probe assembly for use with a charged particle instrument includes an elongate body having a proximal end for positioning outside of a charged particle instrument enclosed environment, a distal end for positioning within the enclosed environment and a longitudinal axis. A port interface is located on the body between the proximal and distal ends, and is coupleable to a nanomanipulator system of the charged particle instrument. A probe needle is positioned at a distal end of the body and is selectively positionable from outside the enclosed environment to contact a specimen within the enclosed environment. At least one gas injection needle is adjustably positioned near the probe needle. The gas injection needle is connectable to a source of pressurized gas to selectively inject gas in the area of the probe needle within the enclosed environment.