Patents by Inventor Daniel Frank Turner

Daniel Frank Turner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample inspection apparatus
    Patent number: 7151269
    Abstract: A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.
    Type: Grant
    Filed: May 10, 2005
    Date of Patent: December 19, 2006
    Assignee: Oxford Instruments Analytical Ltd.
    Inventors: Santokh Singh Bhadare, Ian Richard Barkshire, Daniel Frank Turner