Patents by Inventor Daniel G. Smith

Daniel G. Smith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11923916
    Abstract: A system for transmitting power and data between two circuit boards may include a fixed circuit board having a primary coil and a rotatable circuit board having a secondary coil. The system may further include a sensor in communication with the secondary coil of the rotatable circuit board. The fixed circuit board's primary coil may be inductively coupled to the secondary coil and may provide power and receive data from the sensor when inductively coupled to the secondary coil.
    Type: Grant
    Filed: January 28, 2021
    Date of Patent: March 5, 2024
    Assignee: NUSTEP, LLC
    Inventors: Richard T. Smith, Daniel C. Shnidman, Kevin G. Obrigkeit, Neil M. Cole, Nathan V. Goslee
  • Patent number: 10180496
    Abstract: Laser radar systems include a pentaprism configured to scan a measurement beam with respect to a target surface. A focusing optical assembly includes a corner cube that is used to adjust measurement beam focus. Target distance is estimated based on heterodyne frequencies between a return beam and a local oscillator beam. The local oscillator beam is configured to propagate to and from the focusing optical assembly before mixing with the return beam. In some examples, heterodyne frequencies are calibrated with respect to target distance using a Fabry-Perot interferometer having mirrors fixed to a lithium aluminosilicate glass-ceramic tube.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: January 15, 2019
    Assignees: Nikon Corporation, Nikon Metrology NV
    Inventors: Daniel G. Smith, Eric Peter Goodwin, Anthony R. Slotwinski, Mina A. Rezk, Alexander Cooper, Thomas M. Hedges
  • Patent number: 10139492
    Abstract: Laser radar systems include a pentaprism configured to scan a measurement beam with respect to a target surface. A focusing optical assembly includes a corner cube that is used to adjust measurement beam focus. Target distance is estimated based on heterodyne frequencies between a return beam and a local oscillator beam. The local oscillator beam is configured to propagate to and from the focusing optical assembly before mixing with the return beam. In some examples, heterodyne frequencies are calibrated with respect to target distance using a Fabry-Perot interferometer having mirrors fixed to a lithium aluminosilicate glass-ceramic tube.
    Type: Grant
    Filed: February 27, 2017
    Date of Patent: November 27, 2018
    Assignee: Nikon Corporation
    Inventors: Mina A. Rezk, Anthony R. Slotwinski, Daniel G. Smith, Eric Peter Goodwin, Alexander Cooper, Thomas M. Hedges
  • Patent number: 9964745
    Abstract: Focus assemblies for laser radar are situated to receive a measurement beam that is focused at or in the focus assemblies. In some examples, focus assemblies include a corner cube and a return reflector, and the measurement beam is focused on, at, or within the corner cube or return reflector. A polarizing beam splitter and a quarter wave plate can be situated so that an input measurement beam and an output measurement beam can be separated.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: May 8, 2018
    Assignee: Nikon Corporation
    Inventor: Daniel G. Smith
  • Publication number: 20170168143
    Abstract: Laser radar systems include a pentaprism configured to scan a measurement beam with respect to a target surface. A focusing optical assembly includes a corner cube that is used to adjust measurement beam focus. Target distance is estimated based on heterodyne frequencies between a return beam and a local oscillator beam. The local oscillator beam is configured to propagate to and from the focusing optical assembly before mixing with the return beam. In some examples, heterodyne frequencies are calibrated with respect to target distance using a Fabry-Perot interferometer having mirrors fixed to a lithium aluminosilicate glass-ceramic tube.
    Type: Application
    Filed: February 27, 2017
    Publication date: June 15, 2017
    Applicants: Nikon Corporation, Nikon Metrology NV
    Inventors: Mina A. Rezk, Anthony R. Slotwinski, Daniel G. Smith, Eric Peter Goodwin, Alexander Cooper, Thomas M. Hedges
  • Patent number: 9638799
    Abstract: Laser radar systems include a pentaprism configured to scan a measurement beam with respect to a target surface. A focusing optical assembly includes a corner cube that is used to adjust measurement beam focus. Target distance is estimated based on heterodyne frequencies between a return beam and a local oscillator beam. The local oscillator beam is configured to propagate to and from the focusing optical assembly before mixing with the return beam. In some examples, heterodyne frequencies are calibrated with respect to target distance using a Fabry-Perot interferometer having mirrors fixed to a lithium aluminosilicate glass-ceramic tube.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: May 2, 2017
    Assignees: Nikon Corporation, Nikon Metrology NV
    Inventors: Eric Peter Goodwin, Daniel G. Smith, Alexander Cooper, Mina A. Rezk, Anthony R. Slotwinski, Thomas M. Hedges
  • Patent number: 9618619
    Abstract: Laser radar systems include a pentaprism configured to scan a measurement beam with respect to a target surface. A focusing optical assembly includes a corner cube that is used to adjust measurement beam focus. Target distance is estimated based on heterodyne frequencies between a return beam and a local oscillator beam. The local oscillator beam is configured to propagate to and from the focusing optical assembly before mixing with the return beam. In some examples, heterodyne frequencies are calibrated with respect to target distance using a Fabry-Perot interferometer having mirrors fixed to a lithium aluminosilicate glass-ceramic tube.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: April 11, 2017
    Assignees: Nikon Corporation, Nikon Metrology NV
    Inventors: Mina A. Rezk, Anthony R. Slotwinski, Daniel G. Smith, Eric Peter Goodwin, Alexander Cooper, Thomas M. Hedges
  • Patent number: 9587977
    Abstract: Boresight and other pointing errors are detected based on a monitor beam formed by diverting a portion of a probe beam. The monitor beam is directed to a position sensitive photodetector, and the optical power received at the position sensitive photodetector is used to estimate or correct such pointing errors.
    Type: Grant
    Filed: August 26, 2013
    Date of Patent: March 7, 2017
    Assignee: Nikon Corporation
    Inventors: Daniel G. Smith, W. Thomas Novak
  • Patent number: 9335159
    Abstract: An exemplary method involves, in a system comprising a tool that performs a task on a workpiece, a method for determining displacement of the workpiece relative to the tool. Respective displacements of loci of at least a region of the workpiece are mapped using a Goos-Hänchen-insensitive (GH-insensitive) displacement sensor to produce a first set of physical displacement data for the region. Also mapped are respective displacements, from the tool, of the loci using a GH sensitive sensor to produce a second set of optical displacement data for the region. Goodness of fit (GOF) is determined of the second set of data with the first set. According to the GOF, respective GH-correction (GHC) coefficients are determined for at least one locus of the region. When measuring displacement of the at least one locus in the region relative to the tool, the respective GHC coefficient is applied to the measured displacement to reduce an error that otherwise would be present in the measured displacement due to a GH effect.
    Type: Grant
    Filed: August 19, 2014
    Date of Patent: May 10, 2016
    Assignee: Nikon Corporation
    Inventors: Michael Sogard, Daniel G. Smith, David M. Williamson
  • Patent number: 9243901
    Abstract: Fringe projection autofocus systems are provided with variable pitch diffraction gratings or multiple diffraction gratings so that a reference beam and a measurement beam propagate along a common path. Alternatively, an input beam can be directed to a diffraction grating so that the selected diffraction orders propagate along a common path. In some examples, distinct spectral bands are used for reference and measurement beams.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: January 26, 2016
    Assignee: Nikon Corporation
    Inventors: Eric Peter Goodwin, Daniel G. Smith
  • Patent number: 9091172
    Abstract: A gas turbine engine is disclosed having a cooling passage that rotates with a turbine and is capable of providing cooling flow to the turbine. In one embodiment the cooling passage can receive cooling flow from an interior of a shaft of the gas turbine engine and increase the pressure of the cooling flow before delivering it to a location near a blade of the turbine. In one form the cooling passage can have an inducer section. In one form the cooling passage can have internal vanes useful in increasing the pressure of the cooling flow.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: July 28, 2015
    Assignee: Rolls-Royce Corporation
    Inventors: Christopher Wolfgram, David A. Otero, Daniel G. Smith, Bill Westphal
  • Patent number: 9030668
    Abstract: Fringe patterns at first and second spatial frequencies are projected onto a work piece surface and a reference surface, respectively. An image of the projected fringe patterns is obtained and a measurement signal associated with work piece displacements and a reference signal are obtained based on the first and second spatial frequencies. The image of the projected fringe patterns can exhibit substantial or complete overlap of the fringe patterns at the first and second spatial frequencies, and the overlapping patterns can be separated based on the spatial frequencies. Fringe pattern shifts at one or both of the first and second spatial frequencies can be used to adjust a pattern transfer system to permit accurate pattern transfer.
    Type: Grant
    Filed: March 11, 2013
    Date of Patent: May 12, 2015
    Assignee: Nikon Corporation
    Inventors: Eric Peter Goodwin, Daniel G. Smith
  • Publication number: 20150015896
    Abstract: An exemplary method involves, in a system comprising a tool that performs a task on a workpiece, a method for determining displacement of the workpiece relative to the tool. Respective displacements of loci of at least a region of the workpiece are mapped using a Goos-Hänchen-insensitive (GH-insensitive) displacement sensor to produce a first set of physical displacement data for the region. Also mapped are respective displacements, from the tool, of the loci using a GH sensitive sensor to produce a second set of optical displacement data for the region. Goodness of fit (GOF) is determined of the second set of data with the first set. According to the GOF, respective GH-correction (GHC) coefficients are determined for at least one locus of the region. When measuring displacement of the at least one locus in the region relative to the tool, the respective GHC coefficient is applied to the measured displacement to reduce an error that otherwise would be present in the measured displacement due to a GH effect.
    Type: Application
    Filed: August 19, 2014
    Publication date: January 15, 2015
    Applicant: Nikon Corporation
    Inventors: Michael Sogard, Daniel G. Smith, David M. Williamson
  • Patent number: 8842296
    Abstract: An exemplary method involves, in a system comprising a tool that performs a task on a workpiece, a method for determining displacement of the workpiece relative to the tool. Respective displacements of loci of at least a region of the workpiece are mapped using a Goos-Hänchen-insensitive (GH-insensitive) displacement sensor to produce a first set of physical displacement data for the region. Also mapped are respective displacements, from the tool, of the loci using a GH sensitive sensor to produce a second set of optical displacement data for the region. Goodness of fit (GOF) is determined of the second set of data with the first set. According to the GOF, respective GH-correction (GHC) coefficients are determined for at least one locus of the region. When measuring displacement of the at least one locus in the region relative to the tool, the respective GHC coefficient is applied to the measured displacement to reduce an error that otherwise would be present in the measured displacement due to a GH effect.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: September 23, 2014
    Assignee: Nikon Corporation
    Inventors: Michael Sogard, Daniel G. Smith, David M. Williamson
  • Publication number: 20140211186
    Abstract: A way of predicting distribution of light in an illumination pupil, comprising: (a) identifying one or more component(s) of an illumination system having an illumination pupil, where the component(s) affect the distribution of light in the illumination pupil; (b) generating a point spread function that depends on the identified component(s) and has a functional relationship with the configurable settings of the illumination system; and (c) predicting the distribution of light in the illumination pupil using the point spread function.
    Type: Application
    Filed: April 1, 2014
    Publication date: July 31, 2014
    Inventors: Daniel G. Smith, Donis Flagello
  • Publication number: 20140063491
    Abstract: Boresight and other pointing errors are detected based on a monitor beam formed by diverting a portion of a probe beam. The monitor beam is directed to a position sensitive photodetector, and the optical power received at the position sensitive photodetector is used to estimate or correct such pointing errors.
    Type: Application
    Filed: August 26, 2013
    Publication date: March 6, 2014
    Applicant: Nikon Corporation
    Inventors: Daniel G. Smith, W. Thomas Novak
  • Publication number: 20140063481
    Abstract: Focus assemblies for laser radar are situated to receive a measurement beam that is focused at or in the focus assemblies. In some examples, focus assemblies include a corner cube and a return reflector, and the measurement beam is focused on, at, or within the corner cube or return reflector. A polarizing beam splitter and a quarter wave plate can be situated so that an input measurement beam and an output measurement beam can be separated.
    Type: Application
    Filed: March 14, 2013
    Publication date: March 6, 2014
    Applicant: NIKON CORPORATION
    Inventor: Daniel G. Smith
  • Publication number: 20140049761
    Abstract: Fringe projection autofocus systems are provided with variable pitch diffraction gratings or multiple diffraction gratings so that a reference beam and a measurement beam propagate along a common path. Alternatively, an input beam can be directed to a diffraction grating so that the selected diffraction orders propagate along a common path. In some examples, distinct spectral bands are used for reference and measurement beams.
    Type: Application
    Filed: March 13, 2013
    Publication date: February 20, 2014
    Applicant: NIKON CORPORATION
    Inventors: Eric Peter Goodwin, Daniel G. Smith
  • Publication number: 20130308140
    Abstract: Fringe patterns at first and second spatial frequencies are projected onto a work piece surface and a reference surface, respectively. An image of the projected fringe patterns is obtained and a measurement signal associated with work piece displacements and a reference signal are obtained based on the first and second spatial frequencies. The image of the projected fringe patterns can exhibit substantial or complete overlap of the fringe patterns at the first and second spatial frequencies, and the overlapping patterns can be separated based on the spatial frequencies. Fringe pattern shifts at one or both of the first and second spatial frequencies can be used to adjust a pattern transfer system to permit accurate pattern transfer.
    Type: Application
    Filed: March 11, 2013
    Publication date: November 21, 2013
    Applicant: NIKON CORPORATION
    Inventors: Eric Peter Goodwin, Daniel G. Smith
  • Patent number: 8582119
    Abstract: A metrology system that uses a plurality of photo-detecting targets positioned on the objects to be assembled, a plurality of rotating photo-emitting heads, a master signal generator that generates a reference RF signal, and a signal processor that determines the position of each of the targets from signals generated by each target in response to the photo-emitting heads. During operation, the reference RF signal is broadcast to the rotating photo-emitting heads and the photo-detecting targets. The RF signal is used to determine the azimuth of the heads relative to a zero reference position to a high degree of accuracy.
    Type: Grant
    Filed: August 22, 2011
    Date of Patent: November 12, 2013
    Assignee: Nikon Corporation
    Inventors: W. Thomas Novak, Daniel G. Smith, Lloyd Holland