Patents by Inventor Daniel Heyer

Daniel Heyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8898916
    Abstract: A portable device for measuring a deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference support adjacent the first end, a second removable reference support adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference support and the second removable reference support, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference support and the second removable reference support.
    Type: Grant
    Filed: December 13, 2011
    Date of Patent: December 2, 2014
    Assignee: EFI Global, Inc.
    Inventor: Daniel Heyer
  • Patent number: 8407906
    Abstract: A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: April 2, 2013
    Assignee: Cunningham Lindsey U.S., Inc.
    Inventor: Daniel Heyer
  • Publication number: 20120174422
    Abstract: A portable device for measuring a deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference support adjacent the first end, a second removable reference support adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference support and the second removable reference support, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference support and the second removable reference support.
    Type: Application
    Filed: December 13, 2011
    Publication date: July 12, 2012
    Inventor: Daniel Heyer
  • Publication number: 20120042530
    Abstract: A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.
    Type: Application
    Filed: August 17, 2011
    Publication date: February 23, 2012
    Inventor: Daniel Heyer
  • Patent number: 8104187
    Abstract: A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.
    Type: Grant
    Filed: November 10, 2009
    Date of Patent: January 31, 2012
    Inventor: Daniel Heyer
  • Publication number: 20110107609
    Abstract: A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.
    Type: Application
    Filed: November 10, 2009
    Publication date: May 12, 2011
    Inventor: Daniel Heyer