Abstract: Apparatus for inducing, impeding, selectively filtering or otherwise effecting fluid flow in microfluidics applications. Opposing mesh layers are placed into relative motion by a variety of motive forces. Fluid between the opposing mesh layers is compressed so as to be pumped through the mesh layers when the relative motion of the layers is toward each other. Mesh layers may also be offset from each other though an actuating force so that one mesh layer blocks the openings in the other mesh layer, thereby creating an impediment to fluid flow. The degree of offset may be varied so as to create a partial impediment to fluid flow, thereby presenting a filter effect.

Abstract: A novel microelectromechanical system artificial neural network (MEMS ANN) device performs the function of a conventional artificial neural network node element. Micro-machined polysilicon or high aspect ratio composite beam micro-resonators replace as computational elements the silicon transistors and software simulations of prior-art ANNs. The basic MEMSANN device forms a non-linear (e.g., sigmoid) function of a sum of products. Products of the magnitudes of sine waves, applied to the input drive comb and shuttle magnitudes, are formed in the frequency domain and summed by coupling a plurality of resonators with a mechanical coupling frame, or by integrating them into one resonator. A sigmoid function is applied to the sum of products by shaping the overlap capacitance of the output comb fingers of the resonator. Methods of building and using various single MEMS ANN devices and multi-layered arrays of MEMS ANN circuits are also described.

Abstract: Apparatus for inducing, impeding, selectively filtering or otherwise effecting fluid flow in microfluidics applications. Opposing mesh layers are placed into relative motion by a variety of motive forces. Fluid between the opposing mesh layers is compressed so as to be pumped through the mesh layers when the relative motion of the layers is toward each other. Mesh layers may also be offset from each other though an actuating force so that one mesh layer blocks the openings in the other mesh layer, thereby creating an impediment to fluid flow. The degree of offset may be varied so as to create a partial impediment to fluid flow, thereby presenting a filter effect.

Abstract: An ATM network traffic shaper is implemented in hardware. The traffic shaper shapes transmit data on one or more virtual circuits (VCs) according to the specified quality of service (QoS) parameters. Thus, the traffic shaper provides for the delivery of associated data cells in accordance with the specified QoS parameters. The traffic shaper is scalable in that the number of supported VCs can be increased with a relatively small increase in the size of the device and associated logic gates. The traffic shaper supports constant bit rate (CBR), variable bit rate (VBR), and unknown bit rate (UBR) service types and generates cell transmit requests with zero cell delay variation (CDVT). The traffic shaper also provides very high resolution in terms of bit rate specification. Varying shaping resolutions are achieved by varying a shaping interval time (SIT) generated by a SIT counter.

Abstract: A queue monitoring system and method determines when one or more transmit queues have reached a state that requires action by the host processing device, without the need for periodic polling of transmit status or excessive interrupt servicing. The queue monitoring implements an interrupt mechanism that generates an interrupt if one or more of the transmit queues has gone from a non-empty state to an empty state, and remained in the empty state for a (programmable) period of time. The combination of queue status checking (when adding new transmit data) with the queue monitoring interrupt mechanism removes the need for periodic polling of queue status and handling of interrupts generation on the completed transmission of data from one or more transmit buffer.

Abstract: A communications system and method provide the capability to allow traffic source data from multiple transmit queues to be combined on a single VC and to allow the order of transmission from each queue to be based on a priority value assigned to each queue. This capability allows multiple services to share a VC without sacrificing the ability to prioritize one service class over another. With this system and method, it is possible to establish one transmit queue for low QoS data services, another for higher QoS data services, and a third for highest QoS video services, and have all three services share a single VC. The system and method ensure that the higher QoS transmit packets get sent before lower QoS transmit packets.

Abstract: Apparatus and method to measure the characteristics of the substantially periodic motion of a mechanical system. A non-intrusive technique measures such motion by analyzing images of a movable component of the system without requiring a motion sensor built into the system. If the system includes a motion sensor, the present invention can calibrate it. The present invention applies to an object of any length scale if it can be imaged. The amplitude of a component's motion is obtained from a single, time-exposed image while the system is in periodic motion and a reference image made with the component at rest. The technique, implemented as one component of an automated test-bed apparatus, is significantly faster than the prior art. The present invention is especially efficient in characterizing the mechanical performance of MEMS. Speed facilitates both hands-on testing of prototypes and testing in production environments.

Abstract: A method is disclosed for testing or screening metal or polysilicon conductors and contacts on microelectronic devices that it uses a modified design layout for individual logic gates to enable high current density testing of all such elements used in the final functional circuit. The method uses a special metal pattern adding metal conductor paths to enable high current testing of normal conductors and contacts at an intermediate point during fabrication. The metal layer is patterned a second time to remove the high current paths and enable functional operation. This allows burn-in and screen testing to be performed at higher current densities than would otherwise be possible.

Abstract: An apparatus for applying high current fast rise time pulses simulating electrostatic discharge (ESD) to various combinations of pins of a device under test (e.g., a microcircuit). The apparatus also provides for testing of the DUT after the performance of ESD stress testing. The apparatus establishes electrical connections between the terminals of a high voltage pulse generator (HVPG) and several different combinations of the DUT pins in sequence in order to apply ESD stresses. The apparatus further provides functional parameter tests whether the connection to the DUT pins during ESD stressing has caused the DUT to fail.

Abstract: A method for characterizing critical timing paths and analyzing timing related failure modes in high clock rate photocurrent at the drain of a single transistor in a very large scale integrated circuit. The laser testing apparatus utilized with the method of this invention incorporates therein a laser having its output beam focused onto the drain junction of the transistor under test. The localized injection of electromagnetic radiation produces a photocurrent at the drain junction of the transistor at specific times during the testing procedure which increases the logic level transition times associated with that particular node. This causes an increase in the minimum operating power supply and/or a decrease in the maximum operating frequency at which the microcircuit will properly function. Consideration of these parameters and the level of photocurrent provide a measurement related to the worst case timing margin which occurs during the functional test of the integrated microcircuit.

Abstract: Nondestructive testing and analyzing of surface acoustic wave (SAW) interdigital transducers is accomplished by observing electro-optic changes in a layer of liquid crystals produced by the effects of electric fields resulting from an electrical potential applied to the transducer. A display cell comprising a liquid crystal layer covered with a gold coated glass coverplate is fabricated on the surface of the SAW substrate under test. The assembled display cell is positioned for viewing under a microscope equipped for vertical illumination by a light source and a beam splitter. Polarizers are positioned in the illumination and viewing paths. An electrical potential is applied to the SAW device transducers and in some instances to the coverplate gold coat. Electro-optic effects produced in the liquid crystal by the electric field effects of the applied electrical potential are viewed through the microscope and are analyzed and interpreted.

Abstract: An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded.