Patents by Inventor Daniel Lee Corum

Daniel Lee Corum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detecting a defect of an integrated circuit
    Patent number: 6922235
    Abstract: Detecting a defect of an integrated circuit includes illuminating an integrated circuit with an optical beam. The integrated circuit includes a substrate, a dielectric layer disposed outwardly from the substrate, and a sequence of metal links disposed within the dielectric layer. An end metal link of the sequence of metal links is grounded. A change of relative brightness of the dielectric layer proximate to the sequence of metal links is detected. The change of relative brightness comprises a difference between a first brightness associated with a first metal link and a second brightness associated with a second metal link coupled to the first metal link. The change of relative brightness is associated with a defect of the integrated circuit.
    Type: Grant
    Filed: May 6, 2002
    Date of Patent: July 26, 2005
    Assignee: Texas Instruments Incorporated
    Inventors: Daniel Lee Corum, Taylor Jon Lowry
  • Detecting a defect of an integrated circuit
    Publication number: 20030206293
    Abstract: Detecting a defect of an integrated circuit includes illuminating an integrated circuit with an optical beam. The integrated circuit includes a substrate, a dielectric layer disposed outwardly from the substrate, and a sequence of metal links disposed within the dielectric layer. An end metal link of the sequence of metal links is grounded. A change of relative brightness of the dielectric layer proximate to the sequence of metal links is detected. The change of relative brightness comprises a difference between a first brightness associated with a first metal link and a second brightness associated with a second metal link coupled to the first metal link. The change of relative brightness is associated with a defect of the integrated circuit.
    Type: Application
    Filed: May 6, 2002
    Publication date: November 6, 2003
    Applicant: Texas Instruments Incorporated
    Inventors: Daniel Lee Corum, Taylor Jon Lowry