Patents by Inventor Daniel Lichau

Daniel Lichau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260170677
    Abstract: Methods include acquiring a series of images or spectra of a volume of a model sample, reconstructing a 3D image of the volume of the model sample using the series of images, constructing a 3D model of the volume of the model sample by forming a segmentation of the reconstructed 3D image and fitting one or more primitive geometrical shapes to the segmentation, acquiring test sample images or spectra, and measuring test sample critical dimensions using the constructed 3D model to guide analysis of test spectra or images. Additional methods and related systems are disclosed, optical critical dimension (OCD) methods and systems.
    Type: Application
    Filed: February 5, 2026
    Publication date: June 18, 2026
    Applicant: FEI Company
    Inventors: John Flanagan, Mary Wu, Erik Franken, Daniel Lichau
  • Patent number: 12567165
    Abstract: Methods include acquiring a series of images or spectra of a volume of a model sample, reconstructing a 3D image of the volume of the model sample using the series of images, constructing a 3D model of the volume of the model sample by forming a segmentation of the reconstructed 3D image and fitting one or more primitive geometrical shapes to the segmentation, acquiring test sample images or spectra, and measuring test sample critical dimensions using the constructed 3D model to guide analysis of test spectra or images. Additional methods and related systems are disclosed, optical critical dimension (OCD) methods and systems.
    Type: Grant
    Filed: February 2, 2022
    Date of Patent: March 3, 2026
    Assignee: FEI Company
    Inventors: John Flanagan, Mary Wu, Erik Franken, Daniel Lichau
  • Publication number: 20230245334
    Abstract: Methods include acquiring a series of images or spectra of a volume of a model sample, reconstructing a 3D image of the volume of the model sample using the series of images, constructing a 3D model of the volume of the model sample by forming a segmentation of the reconstructed 3D image and fitting one or more primitive geometrical shapes to the segmentation, acquiring test sample images or spectra, and measuring test sample critical dimensions using the constructed 3D model to guide analysis of test spectra or images. Additional methods and related systems are disclosed, optical critical dimension (OCD) methods and systems.
    Type: Application
    Filed: February 2, 2022
    Publication date: August 3, 2023
    Applicant: FEI Company
    Inventors: John Flanagan, Mary Wu, Erik Franken, Daniel Lichau