Patents by Inventor Daniel Meir Amar

Daniel Meir Amar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for joint image and lidar annotation and calibration
    Patent number: 11195065
    Abstract: A calibration system includes a processing circuit configured to receive data corresponding to a first image where the data includes information corresponding to a 2D BEV of a scene, and to receive data corresponding to a second image where the data includes information corresponding to a 2D image of the scene. The processing circuit may determine a salient feature in the first image or the second image, and project, based on a first calibration setting, the salient feature from the first image to the second image or vice versa. The processing circuit may select a region corresponding to the projected salient feature in the first image or the second image, determine an identity of the salient feature, and determine a second calibration setting based on the identity of the salient feature and the selected region corresponding to the salient feature in the 2D BEV and the 2D image.
    Type: Grant
    Filed: February 3, 2020
    Date of Patent: December 7, 2021
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Alireza Aliamiri, Daniel Meir Amar
  • SYSTEM AND METHOD FOR JOINT IMAGE AND LIDAR ANNOTATION AND CALIBRATION
    Publication number: 20210158079
    Abstract: A calibration system includes a processing circuit configured to receive data corresponding to a first image where the data includes information corresponding to a 2D BEV of a scene, and to receive data corresponding to a second image where the data includes information corresponding to a 2D image of the scene. The processing circuit may determine a salient feature in the first image or the second image, and project, based on a first calibration setting, the salient feature from the first image to the second image or vice versa. The processing circuit may select a region corresponding to the projected salient feature in the first image or the second image, determine an identity of the salient feature, and determine a second calibration setting based on the identity of the salient feature and the selected region corresponding to the salient feature in the 2D BEV and the 2D image.
    Type: Application
    Filed: February 3, 2020
    Publication date: May 27, 2021
    Inventors: Alireza Aliamiri, Daniel Meir Amar