Abstract: A leaky waveguide is disclosed herein. The leaky waveguide includes a pair of parallel metal plates with open sides and a slot in one of the parallel metal plates. The slot is configured to emit waves at certain angles depending on one or more frequencies of a carrier frequency.

Abstract: A method for scanning near-field optical microscopy comprises illuminating an apertureless atomic force microscopy (AFM) probe with electromagnetic energy having a frequency in the Terahertz range, where the sample under observation includes a dielectric layer having a thickness greater than the radius of the tip of the AFM probe. A system for scanning near-field optical microscopy comprises a collimated light source for emitting collimated light, a photoconductive antenna for converting collimated light into electromagnetic energy having a frequency in the Terahertz range, an AFM probe, a sample comprising a dielectric layer, the dielectric layer having a thickness greater than the radius of the probe tip; and a detector configured to detect energy that has interacted with the sample.

Abstract: A multi-frequency wireless access device including a first waveguide having a pair of parallel metal plates with open sides and a slot in one of the metal plates, the slot permitting radiation to leak out, the leaked radiation illuminating a range of angles depending on frequency.

Abstract: A multi-frequency wireless access device including a first waveguide having a pair of parallel metal plates with open sides and a slot in one of the metal plates, the slot permitting radiation to leak out, the leaked radiation illuminating a range of angles depending on frequency.

Abstract: A multi-frequency wireless access device including a first waveguide having a pair of parallel metal plates with open sides and a slot in one of the metal plates, the slot permitting radiation to leak out, the leaked radiation illuminating a range of angles depending on frequency.

Abstract: A method for scanning near-field optical microscopy comprises illuminating an apertureless atomic force microscopy (AFM) probe with electromagnetic energy having a frequency in the Terahertz range, where the sample under observation includes a dielectric layer having a thickness greater than the radius of the tip of the AFM probe. A system for scanning near-field optical microscopy comprises a collimated light source for emitting collimated light, a photoconductive antenna for converting collimated light into electromagnetic energy having a frequency in the Terahertz range, an AFM probe, a sample comprising a dielectric layer, the dielectric layer having a thickness greater than the radius of the probe tip; and a detector configured to detect energy that has interacted with the sample.

Abstract: A multi-frequency wireless access device including a first waveguide having a pair of parallel metal plates with open sides and a slot in one of the metal plates, the slot permitting radiation to leak out, the leaked radiation illuminating a range of angles depending on frequency.

Abstract: A sensor comprising at least one photonic crystal, at least one light source capable of illuminating the crystal with a light beam having a predetermined wavelength and direction, and at least one position sensing detector positioned so as to detect the position of said light beam after it is transmitted by the crystal. Sensing is achieved by saturating the crystal with a liquid so as to produce a saturated crystal having a first refractive index, calculating for the crystal a dispersion surface and using the dispersion surface to calculate a effective incident light vector; and illuminating the saturated crystal with at least one light beam, the beam being incident substantially along the calculated effective incident light vector such that if the saturated crystal is modified to have a second refractive index, the position-sensing detector will detect a change in position of the transmitted light beam.