Patents by Inventor Daniel Murdoch Cotton

Daniel Murdoch Cotton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Time resolved non-invasive diagnostics system
    Patent number: 7466852
    Abstract: A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).
    Type: Grant
    Filed: May 8, 2007
    Date of Patent: December 16, 2008
    Assignee: DCG Systems, Inc.
    Inventors: Daniel Murdoch Cotton, Nader Pakdaman, James Squire Vickers, Thomas Wong
  • Time resolved non-invasive diagnostics system
    Patent number: 7224828
    Abstract: A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: May 29, 2007
    Assignee: Credence Systems Corporation
    Inventors: Daniel Murdoch Cotton, Nader Pakdaman, James Squire Vickers, Thomas Wong
  • Time resolved non-invasive diagnostics system
    Publication number: 20030210057
    Abstract: A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).
    Type: Application
    Filed: June 9, 2003
    Publication date: November 13, 2003
    Inventors: Daniel Murdoch Cotton, Nader Pakdaman, James Squire Vickers, Thomas Wong
  • Time resolved non-invasive diagnostics system
    Patent number: 6621275
    Abstract: A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: September 16, 2003
    Assignee: Optonics Inc.
    Inventors: Daniel Murdoch Cotton, Nader Pakdaman, James Squire Vickers, Thomas Wong
  • Time resolved non-invasive diagnostics system
    Publication number: 20030098692
    Abstract: A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).
    Type: Application
    Filed: November 28, 2001
    Publication date: May 29, 2003
    Inventors: Daniel Murdoch Cotton, Nader Pakdaman, James Squire Vickers, Thomas Wong