Abstract: The invention relates to a method of evaluating a sample using charged particle microscopy, comprising the steps of a sample containing primary particles of interest. The method further comprises the steps of imaging said sample using said charged particle microscope for obtaining at least one image of said primary particles; and determining a concentration of said primary particles using said at least one image. As defined herein, the sample further contains secondary particles that are independent from said primary particles, and which are present in said at least one image. The method is characterized by the steps of providing a known concentration of said secondary particles and using said known concentration of said secondary particles in said step of determining said concentration of said primary particles.

Abstract: A fastener torque-application and marking tool and method. An example embodiment relates to a fastener marking method comprising the steps of rotating a fastener with a torque-application device, stopping the rotation of the fastener, determining the torque value of the fastener, and marking the fastener or adjacent surface with a marking mechanism attached to the torque-application device. In another embodiment, a fastener torque application and marking tool system comprises a torque application device configured to rotate a fastener, a measuring mechanism attached to the torque application device, a marking mechanism attached to the torque-application device, and a reader that reads a unique identifier and confirms proper torqueing. In another embodiment, a torque application and marking tool comprises a handle, a driver, a fastener engaging component, a torque control, and a marking mechanism.