Patents by Inventor Daniel Nickel

Daniel Nickel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11218095
    Abstract: A method of controlling an actuator comprising an electric motor and an actuator coupled to the electric motor, the method comprising controlling the electric motor to move the actuator in a direction towards an absolute mechanical end stop until a last registered soft reference position has been reached and then to overtravel the last registered soft reference position by a predetermined distance, detecting the load of the actuator, and updating the registered soft reference position on the basis of the detected load.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: January 4, 2022
    Assignee: MINEBEA MITSUMI INC.
    Inventors: Daniel Nickel, Ullrich Kreiensen, Biancuzzi Giovanni, Fabian Armbruster, Florian Bayer
  • Publication number: 20200153369
    Abstract: A method of controlling an actuator comprising an electric motor and an actuator coupled to the electric motor, the method comprising controlling the electric motor to move the actuator in a direction towards an absolute mechanical end stop until a last registered soft reference position has been reached and then to overtravel the last registered soft reference position by a predetermined distance, detecting the load of the actuator, and updating the registered soft reference position on the basis of the detected load.
    Type: Application
    Filed: November 12, 2019
    Publication date: May 14, 2020
    Inventors: Daniel NICKEL, Ullrich Kreiensen, Biancuzzi Giovanni, Fabian Armbruster, Florian Bayer
  • Publication number: 20050216870
    Abstract: A system, method and program product for performing density checking of an IC design. The invention establishes an evaluation array for the IC design including an array element for each evaluation window of the IC design. The number of evaluation windows is based on a smallest necessary granularity. A single pass through shape data for the IC design is then conducted to populate each array element with a shape area for a corresponding evaluation window. Density checking is performed by iterating over the evaluation array using a sub-array. The sub-array may have the size of the preferred density design rule window. The invention removes the need for repetitive calculations, and results in a more efficient approach to density checking.
    Type: Application
    Filed: March 26, 2004
    Publication date: September 29, 2005
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: William DeCamp, Daniel Nickel