Patents by Inventor Daniel Niederlohner

Daniel Niederlohner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190064302
    Abstract: A method and system for determining a magnetic field map in a MR system based on position of a movable patient support of the MR system are provided, wherein a first resulting field map including position dependent information about a magnetic field distribution in a homogeneity volume including an examination volume of the MR system is provided when the movable patient support is located at a first position, wherein a stationary field map including information about a magnetic field distribution in the homogeneity volume is provided, which is independent of the position of the movable patient support, wherein a position dependent field map including information about a magnetic field distribution in the homogeneity volume mainly influenced by a position of the movable patient support is determined using the stationary field map and the first resulting field map, and wherein a second resulting field map in the homogeneity volume is determined when the movable patient support is located at a second position di
    Type: Application
    Filed: August 21, 2018
    Publication date: February 28, 2019
    Inventors: Thorsten Feiweier, Daniel Niederlöhner
  • Publication number: 20190064303
    Abstract: A method for recording a B0 map of a main magnetic field of a magnetic resonance device in an imaging volume of which an object to be recorded is arranged includes scanning a recording region to be covered by the B0 map by the magnetic resonance device. The recording region is scanned by a map recording sequence slice-by-slice in successive slices in a slice selection direction extending in a phase encoding direction and a readout direction, or three-dimensionally using two phase encoding directions and one readout direction in order to ascertain the B0 map. In a preliminary scan, the magnetic resonance device ascertains extension information describing the extension of the object using a scout sequence, which is used to define the recording region in sequence parameters of the map recording sequence and/or to adjust at least one sequence parameter of the map recording sequence.
    Type: Application
    Filed: August 27, 2018
    Publication date: February 28, 2019
    Inventor: Daniel Niederlöhner
  • Patent number: 10175323
    Abstract: A method for adapting activation parameters used to generate a pulse sequence when activating a magnetic resonance system is provided. The method includes determining stimulation values for the pulse sequence based on predefined activation parameters. The stimulation values represent a stimulation exposure of a patient. Test regions that exhibit stimulation maxima are identified in the pulse sequence, and the identified test regions are tested with respect to compliance with a predefined stimulation limit value.
    Type: Grant
    Filed: February 6, 2015
    Date of Patent: January 8, 2019
    Assignee: Siemens Aktiengesellschaft
    Inventors: Daniel Niederlöhner, Dominik Paul, Jörg Roland
  • Patent number: 9829586
    Abstract: A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: November 28, 2017
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Edgar Göderer, Peter Hackenschmied, Steffen Kappler, Björn Kreisler, Miguel Labayen De Inza, Daniel Niederlöhner, Mario Reinwand, Christian Schröter, Matthias Strassburg, Stefan Wirth
  • Patent number: 9646731
    Abstract: A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, in particular for use in a CT system. In an embodiment, the detector includes a semiconductor material used for detecting the x-ray radiation; at least one collimator; and at least one radiation source, to irradiate the semiconductor material with additional radiation. In at least one embodiment, the at least one collimator includes at least one reflection layer on a side facing the semiconductor material, on which the additional radiation is reflected to the semiconductor material. In another embodiment, a CT system including the direct-converting x-ray radiation detector, and a method for detecting incident x-ray radiation via a direct-converting x-ray radiation detector, in particular for use in a CT system, are disclosed.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: May 9, 2017
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Fabrice Dierre, Edgar Göderer, Peter Hackenschmied, Steffen Kappler, Björn Kreisler, Miguel Labayen De Inza, Daniel Niederlöhner, Mario Reinwand, Christian Schröter, Karl Stierstorfer, Matthias Strassburg, Justus Tonn, Stefan Wirth
  • Patent number: 9400335
    Abstract: A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, at least including a semiconductor used to detect x-ray radiation and at least one electrode attached to the semiconductor. In an embodiment, the semiconductor and the at least one electrode are electrically conductively connected and the at least one electrode is designed to be transparent and electrically conductive. A CT system is further disclosed, at least including the direct-converting x-ray radiation detector.
    Type: Grant
    Filed: July 10, 2013
    Date of Patent: July 26, 2016
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Fabrice Dierre, Björn Kreisler, Miguel Labayen De Inza, Daniel Niederlöhner, Christian Schröter, Matthias Strassburg
  • Patent number: 9223038
    Abstract: An X-ray detector with photon-counting directly converting detector elements and a method for the temperature stabilization of at least one detector element of an X-ray detector of a CT system are disclosed, wherein the detector elements use a sensor material which converts incident photons of radiation directly into free-moving charge in the sensor material and wherein with the aid of a circuit arrangement (e.g. an ASIC), the number of incident photons in relation to predefined energy ranges (e.g., to imaging) is determined, wherein the total electrical power of at least one detector element is kept constant regardless of the incident intensity of radiation.
    Type: Grant
    Filed: March 26, 2013
    Date of Patent: December 29, 2015
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Thilo Hannemann, Edgar Kraft, Daniel Niederlohner
  • Publication number: 20150362578
    Abstract: In order to enable efficient calculation of shim settings for a magnetic resonance imaging system, a method for magnetic resonance imaging of an object under investigation using a magnetic resonance device is provided. The method includes acquiring first magnetic resonance image data of the object under investigation using the magnetic resonance device. The method also includes segmenting the first magnetic resonance image data into at least two material classes, calculating a B0 map based on the segmented first magnetic resonance image data and based on susceptibility values of the at least two material classes, and calculating shim settings based on the calculated B0 map. The method also includes acquiring second magnetic resonance image data of the object under investigation using the magnetic resonance device. The acquisition of the second magnetic resonance image data is undertaken using the calculated shim settings.
    Type: Application
    Filed: June 13, 2015
    Publication date: December 17, 2015
    Inventors: Stephan Biber, Daniel Niederlöhner, Andreas Schmidt, Markus Vester
  • Patent number: 9164183
    Abstract: A method and a detector system are disclosed for the photon-counting detection of x-ray radiation with direct conversion detectors. In at least one embodiment of the method, as a function of the existing radiation energy, current and/or voltage pulses which are largely proportional thereto are generated, and the generated current and voltage pulses are counted in the detector when a predetermined current and/or voltage source is exceeded, whereby a threshold is used as a predetermined current and/or voltage threshold, which corresponds to a detection of a photon with an energy which is less than the k-edge of the detector material used.
    Type: Grant
    Filed: March 14, 2012
    Date of Patent: October 20, 2015
    Assignee: SIEMENS AKTIENGESELLCHAFT
    Inventors: Edgar Kraft, Daniel Niederlöhner, Christian Schröter
  • Publication number: 20150260856
    Abstract: A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, at least including a semiconductor used to detect x-ray radiation and at least one electrode attached to the semiconductor. In an embodiment, the semiconductor and the at least one electrode are electrically conductively connected and the at least one electrode is designed to be transparent and electrically conductive. A CT system is further disclosed, at least including the direct-converting x-ray radiation detector.
    Type: Application
    Filed: July 10, 2013
    Publication date: September 17, 2015
    Applicant: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Fabrice Dierre, Björn Kreisler, Miguel Labayen De Inza, Daniel Niederlöhner, Christian Schröter, Matthias Strassburg
  • Patent number: 9134434
    Abstract: An x-ray detector for a medical imaging device includes an anti-scatter grid, a measuring layer including a regular arrangement of measuring cells, and an evaluation unit. The anti-scatter grid covers the measuring layer and is aligned toward a specific focal point. The evaluation unit is configured to determine a focal position of an x-ray source relative to the focal point based on a local intensity difference of x-rays striking the measuring layer.
    Type: Grant
    Filed: August 1, 2013
    Date of Patent: September 15, 2015
    Assignee: Seimens Aktiengesellschaft
    Inventors: Daniel Niederlöhner, Bodo Reitz, Stefan Wirth
  • Publication number: 20150221406
    Abstract: A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, in particular for use in a CT system. In an embodiment, the detector includes a semiconductor material used for detecting the x-ray radiation; at least one collimator; and at least one radiation source, to irradiate the semiconductor material with additional radiation. In at least one embodiment, the at least one collimator includes at least one reflection layer on a side facing the semiconductor material, on which the additional radiation is reflected to the semiconductor material. In another embodiment, a CT system including the direct-converting x-ray radiation detector, and a method for detecting incident x-ray radiation via a direct-converting x-ray radiation detector, in particular for use in a CT system, are disclosed.
    Type: Application
    Filed: July 9, 2013
    Publication date: August 6, 2015
    Inventors: Fabrice Dierre, Edgar Göderer, Peter Hackenschmied, Steffen Kappler, Björn Kreisler, Miguel Labayen De Inza, Daniel Niederlöhner, Mario Reinwand, Christian Schröter, Karl Stierstorfer, Matthias Strassburg, Justus Tonn, Stefan Wirth
  • Publication number: 20150219736
    Abstract: A method for adapting activation parameters used to generate a pulse sequence when activating a magnetic resonance system is provided. The method includes determining stimulation values for the pulse sequence based on predefined activation parameters. The stimulation values represent a stimulation exposure of a patient. Test regions that exhibit stimulation maxima are identified in the pulse sequence, and the identified test regions are tested with respect to compliance with a predefined stimulation limit value.
    Type: Application
    Filed: February 6, 2015
    Publication date: August 6, 2015
    Inventors: Daniel Niederlöhner, Dominik Paul, Jörg Roland
  • Publication number: 20150212215
    Abstract: A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.
    Type: Application
    Filed: July 9, 2013
    Publication date: July 30, 2015
    Inventors: Edgar Göderer, Peter Hackenschmied, Steffen Kappler, Björn Kreisler, Miguel Labayen De Inza, Daniel Niederlöhner, Mario Reinwand, Christian Schröter, Matthias Strassburg, Stefan Wirth
  • Patent number: 9078625
    Abstract: A method is disclosed for transmitting measurement data from a transmitter system to a receiver system by way of a transmission link of a medical device. In an embodiment, the measurement data, as input data of a transformation method, is transformed to output values and, after transmission, back transformed again, the values of the input data lying between a maximum value and a minimum value and an assignment function being used for compression purposes, to allocate an output value to every value of the input data, a root function being used as the assignment function for at least some of the values.
    Type: Grant
    Filed: December 16, 2011
    Date of Patent: July 14, 2015
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Steffen Kappler, Edgar Kraft, Daniel Niederlöhner, Thomas Reichel, Karl Stierstorfer, Helmut Winkelmann
  • Patent number: 9057791
    Abstract: A quantum-counting radiation detector in which signals of individual pixels and signals of combined pixels are evaluated in parallel processing branches and count results are combined in an appropriate manner, thereby reducing the influence of unwanted interference effects for the respective application.
    Type: Grant
    Filed: June 19, 2012
    Date of Patent: June 16, 2015
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Thilo Hannemann, Silke Janssen, Steffen Kappler, Edgar Kraft, Daniel Niederlöhner, Mario Reinwand
  • Patent number: 9044189
    Abstract: A method and a computed tomography system are disclosed for generating tomographic image datasets of a measurement object. The computed tomography system includes at least two simultaneously operable sets of detector elements which jointly scan a measurement object from a multiplicity of projection angles in an integrating manner on the one hand and an energy-resolving manner on the other hand. In at least one embodiment, the method includes determining a first projection dataset from measurement data recorded in an integrating manner. Further, at least one second projection dataset is determined from energy-resolved measurement data, and in addition a weighted tomographic result image dataset is calculated based on weighted use of the first and the second projection dataset, the weighting being applied to the projection data or the tomographic image data reconstructed therefrom.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: June 2, 2015
    Assignee: Siemens Aktiengesellschaft
    Inventors: Thomas Flohr, Gabriel Haras, Daniel Niederlöhner, Stefan Pflaum
  • Patent number: 9039284
    Abstract: A method is disclosed for energy calibrating quantum-counting x-ray detectors in an x-ray installation including at least two x-ray systems turnable around a center of rotation. A target, for producing x-ray fluorescence radiation, is positioned between the first x-ray source and first x-ray detector and irradiated with x-radiation of the first x-ray source in such a way that x-ray fluorescence radiation which strikes the second x-ray detector from the target is produced by the x-radiation of the first x-ray source. The second x-ray detector is then energy calibrated by way of the x-ray fluorescence radiation of the target. The first x-ray detector can be energy calibrated in the same way with the aid of the x-radiation of the second x-ray source. With the proposed method, the x-ray detectors of a dual-source CT x-ray installation can be calibrated with little expenditure under conditions close to those of the system.
    Type: Grant
    Filed: March 12, 2013
    Date of Patent: May 26, 2015
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Mario Eichenseer, Steffen Kappler, Edgar Kraft, Björn Kreisler, Daniel Niederlöhner, Stefan Wirth
  • Patent number: 8987673
    Abstract: A detector arrangement of an imaging system detector detecting ionizing radiation includes a detector carrier, a plurality of detector modules attached to the detector carrier, and a collimator disposed in the radiation direction in front of the detector modules which are disposed on the incident radiation measurement side. In at least one embodiment, at least one air gap is included for conveying cooling air is disposed between the collimator and the measurement sensors of the detector modules. A method is also disclosed for cooling a detector arrangement of a detector rotating around a system axis with a plurality of measurement sensors disposed next to one another and a collimator arranged in the radiation direction in front of the measurement sensors, wherein cooling air is conveyed in or against the system axis direction between the collimator and the measurement sensors which directly cools the surface of the measurement sensors.
    Type: Grant
    Filed: November 27, 2012
    Date of Patent: March 24, 2015
    Assignee: Siemens Aktiengesellschaft
    Inventors: Daniel Niederlöhner, Claus Pohan
  • Patent number: 8915647
    Abstract: In a method, with a current measurement, the history of the radiation exposure of the X-ray detector is taken into account with respect to the overall X-ray detector or subareas of the X-ray detector, in respect of a reduction in the measurement sensitivity produced as a result and a recovery of the reduction in the measurement sensitivity, and the determined measuring signal is corrected with a correction factor which is dependent on the history of the radiation exposure. Furthermore, an X-ray recording system includes a detector which includes a plurality of detector elements, which are read out in groups channel by channel and a read-out apparatus with computer-assisted device for correcting read-out detector data prior to a further processing of the detector data to form projective or tomographic images.
    Type: Grant
    Filed: March 22, 2012
    Date of Patent: December 23, 2014
    Assignee: Siemens Aktiengesellschaft
    Inventors: Steffen Kappler, Johannes Kippes, Edgar Kraft, Daniel Niederlöhner, Thomas Reichel, Christian Schröter, Thomas Von Der Haar