Abstract: There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.

Abstract: There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.