Abstract: A system for the integrated archiving, restoring, purging, importing and exporting of semiconductor wafer data, the system including a data acquisition system for acquiring scan data from differing types of semiconductor wafer scanning tools such as wafer dimensional tools, wafer inspection tools, and wafer nanotopography tools, a buffer system for providing temporary storage for scan data transmitted over a network from the data acquisition system and for providing fault tolerance, a server system for providing storage for the scan data transmitted from the buffer system and converting the scan data into a format used by and stored in a database management system; and an analysis system client station including a display and communicating with the server system over the network, the analysis system and the server system managing the purging, archiving, restoring, importing and exporting of scan data.

Abstract: A smoke detector (10) has internal self-adjustment and self-diagnostic capabilities. It includes a microprocessor-based alarm control circuit (24) that periodically checks the sensitivity of a smoke sensing element (20) to a smoke level in a spatial region (12). The alarm control circuit and the smoke sensor are mounted in a discrete housing (25) that operatively couples the smoke sensor to the region. The microprocessor (30) implements a routine (50) stored in memory (32) by periodically determining a floating adjustment (FLT.sub.-- ADJ) that is used to adjust the output (RAW.sub.-- DATA) of the smoke sensing element and of any sensor electronics (40) to produce an adjusted output (ADJ.sub.-- DATA) for comparison with an alarm threshold. The floating adjustment is not greater than a maximum value (ADJISENS) or less than a minimum value (ADJSENS). Except at power-up or reset, each floating adjustment is within a predetermined slew limit of the immediately preceding floating adjustment.